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Method and device for measuring antenna far field based on cubic spline interpolation method

A spline interpolation and antenna technology, which is applied in the field of antenna far-field measurement devices based on the cubic spline interpolation method, can solve the problems of high accuracy of the antenna far-field pattern and the inability to reduce the sampling complexity of the antenna near-field measurement.

Active Publication Date: 2019-03-19
BEIJING UNIV OF POSTS & TELECOMM
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Problems solved by technology

[0004] The purpose of the embodiments of the present invention is to provide a method and device for spherical far-field measurement based on the cubic spline interpolation method, so as to solve the problem of not only reducing the sampling complexity of antenna near-field measurement in the prior art, but also ensuring the accuracy of the antenna far-field pattern high degree of problem

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  • Method and device for measuring antenna far field based on cubic spline interpolation method
  • Method and device for measuring antenna far field based on cubic spline interpolation method
  • Method and device for measuring antenna far field based on cubic spline interpolation method

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Embodiment Construction

[0063] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0064] In order to not only reduce the sampling complexity of antenna near-field measurement, but also ensure that the antenna far-field pattern obtained after the near-field data of the antenna is transformed by the near-far field has high accuracy, the embodiment of the present invention provides a three-dimensional A method and device for measuring the far field of an antenna by a spline interpolation method.

[0065] A method for measuring the far field of...

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Abstract

An embodiment of the invention provides a method and a device for measuring antennas in far fields on the basis of cubic spline interpolation processes. The method includes acquiring first spherical near-field data of the antennas; interpolating sampling points by the aid of the cubic spline interpolation processes and determining spherical near-field data corresponding to various interpolation nodes; combining the first spherical near-field data with the spherical near-field data corresponding to the various interpolation nodes so as to obtain second spherical near-field data of the antennas; solving far-field directional patterns of the antennas according to the second spherical near-field data of the antennas. The sampling points correspond to the first spherical near-field data. The spherical near-field data corresponding to the various interpolation nodes are generated by means of interpolation. According to the scheme, the method and the device have the advantages that the antenna near-field measurement sampling complexity can be lowered, and the high accuracy of the far-field directional patterns of the antennas can be guaranteed.

Description

technical field [0001] The invention relates to the technical field of antenna far-field measurement, in particular to a method for measuring antenna far-field based on a cubic spline interpolation method and a device for performing antenna far-field measurement based on a cubic spline interpolation method. Background technique [0002] In recent years, due to the development of communication technology and radar technology, antenna has played a vital role in wireless communication. Antenna measurement is an important part of antenna design. At present, antenna measurement mainly includes near-field measurement of antenna and far-field measurement of antenna. Measurement, because the far-field measurement of the antenna is easily affected by factors such as the environment and the site, it is not convenient for direct measurement. Therefore, the near-field measurement data of the antenna is usually transformed to obtain the far-field pattern of the antenna. The far field pat...

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R29/10
CPCG01R29/10
Inventor 王卫民刘元安李梦吴永乐黎淑兰于翠屏苏明徐世峰
Owner BEIJING UNIV OF POSTS & TELECOMM