Superconductor critical current and shunt temperature test device

A superconducting conductor and critical current technology, applied in superconducting performance measurement, magnetic performance measurement, etc., can solve the problems of high test cost and long test cycle, and achieve good cooling effect, short test cycle and small AC loss.

Inactive Publication Date: 2017-08-18
HEFEI INSTITUTES OF PHYSICAL SCIENCE - CHINESE ACAD OF SCI
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Problems solved by technology

[0005] The critical current and shunt temperature of superconducting conductors are important indicators for evaluating the performance of superconducting conductors. Previously, the performance tests of superconducting conductors needed to be sent abroad for measurement. The test cost was high and the test cycle was long.

Method used

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  • Superconductor critical current and shunt temperature test device

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Embodiment Construction

[0027] See attached figure 1 .

[0028] Superconducting conductor critical current and shunt temperature testing device, including back field magnet 14, variable temperature sample Dewar 12, superconducting transformer 4, low temperature system, low temperature system includes low temperature refrigerator 16, helium liquid storage tank 2, superconducting Transformer Dewar 6, back field magnet Dewar 11, low-temperature transmission pipeline, superconducting transformer Dewar 6 outside the superconducting transformer 4, located below the superconducting transformer Dewar 6, back field magnet Dewar 11, and back field magnet 14 At the bottom of the back field magnet Dewar 11, the lower end of the variable temperature sample Dewar 12 is inserted into the center of the back field magnet 14, and the superconducting conductor sample 15 to be tested is placed in the variable temperature sample Dewar 12, and the back field magnet 14 is the superconductor to be tested. Conductor 15 samp...

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Abstract

The invention discloses a superconductor critical current and shunt temperature test device comprising a back field magnet, a temperature-variable sample dewar, a superconducting transformer, a cryogenic system, and a quenching detection and quenching protection system. The cryogenic system comprises a cryogenic refrigerator, a liquid helium storage tank, a superconducting transformer dewar, a back field magnet dewar, and a cryogenic transmission pipeline. The superconductor critical current and shunt temperature test device of the invention is applicable to superconductor critical current and shunt temperature test in a high back field. The maximum test back field is 10T, and the maximum test current is up to 50kA. The superconductor critical current and shunt temperature test device of the invention has the advantages of high test precision, low test cost, convenience of sample replacement, short test cycle, and the like.

Description

[0001] Technical field: [0002] The invention relates to the field of superconducting conductor testing, in particular to a superconducting conductor critical current and shunt temperature testing device. [0003] Background technique: [0004] Superconducting technology is widely used in fusion devices, high-energy particle accelerators, superconducting energy storage magnets, superconducting magnetic levitation, biomedicine and other fields. Superconducting conductors have excellent performance, especially CICC conductors have the advantages of high stability margin, high insulation breakdown voltage, good mechanical stability, low AC loss, etc. The conductor of choice for magnetic conductors. [0005] The critical current and shunt temperature of superconducting conductors are important indicators for evaluating the performance of superconducting conductors. Previously, the performance tests of superconducting conductors needed to be sent abroad for measurement, and the te...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R33/12
CPCG01R33/1238G01R33/1246
Inventor 刘华军施毅武玉
Owner HEFEI INSTITUTES OF PHYSICAL SCIENCE - CHINESE ACAD OF SCI
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