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Abnormal Pixel Reconstruction Method after Overlapping Cell Segmentation

A technology of abnormal pixels and cells, applied in image enhancement, image analysis, image data processing and other directions, can solve problems such as insufficiency and small data volume, and achieve the effect of reducing errors and reducing effects

Active Publication Date: 2021-04-23
HARBIN UNIV OF SCI & TECH
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  • Abstract
  • Description
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Problems solved by technology

Smaller data volumes cannot meet this requirement

Method used

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  • Abnormal Pixel Reconstruction Method after Overlapping Cell Segmentation
  • Abnormal Pixel Reconstruction Method after Overlapping Cell Segmentation
  • Abnormal Pixel Reconstruction Method after Overlapping Cell Segmentation

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Embodiment Construction

[0052] In order to make the purpose, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments It is a part of embodiments of the present invention, but not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0053] Such as figure 1 The method for reconstructing abnormal pixels after overlapping cell segmentation is provided, including model training and cell reconstruction:

[0054] The model training includes steps:

[0055] S1. Randomly select 1000 single-cell data from the same specimen as training data;

[0056] S2, using the EM algorithm ...

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Abstract

Reconstruction of abnormal pixel points after overlapping cell segmentation, the invention relates to the problem of abnormal pixel points after overlapping cell segmentation in DNA ploidy analysis technology. DNA ploidy analysis technology measures the relative content of cellular DNA through image processing technology, and has a wide range of applications in cancer diagnosis. However, the pixel points after segmentation of overlapping cells are abnormal, resulting in abnormalities in cell texture, gray scale, and the most important optical density, which is very easy to misdiagnose in diagnosis. In order to improve this problem, the present invention proposes a method for reconstructing pixels in overlapping regions of cells based on the GMM‑UBM model. Experiments show that this method can effectively adjust the characteristic values ​​of cell texture, grayscale, and optical density, reduce the error of DNA content measurement, and reduce the impact of abnormal pixels on the recognition rate of the classifier. The invention is applied to the reconstruction of abnormal pixel points after overlapping cell segmentation.

Description

technical field [0001] The present invention designs an abnormal pixel point reconstruction method after overlapping cell segmentation Background technique [0002] In recent years, the high incidence of cervical cancer has become a social problem that threatens women's lives. Among women all over the world, about 527,600 people are newly diagnosed with cervical cancer every year, and nearly 265,000 people die from the disease, and 90% of the dead are located in underdeveloped areas. About 75,000 new cases of cervical cancer are discovered in China every year, accounting for 1 / 7 of the total number of new cases of cervical cancer in the world, and 35,000 people die from the disease. The current effective cervical cancer screening method is cervical exfoliated cell smear pathological examination. This method requires experienced pathologists to make a diagnosis after observing the diseased cells under a microscope, which will consume a lot of manpower and material resources...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06T5/00G06T7/11
CPCG06T7/11G06T2207/30096G06T5/00
Inventor 谢怡宁赵晶余莲何勇军孙广路
Owner HARBIN UNIV OF SCI & TECH
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