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Method and system for handling abnormal oscillation of power module overshoot test at full load power-on

A technology of a power supply module and a processing method, which is applied in the field of server power supply testing, to achieve the effect of solving the overshoot test full-load power-on abnormal oscillation and improving the test efficiency

Active Publication Date: 2021-02-02
INSPUR SUZHOU INTELLIGENT TECH CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0005] Embodiments of the present invention provide a method and system for processing abnormal oscillations when power-on at full load in overshoot tests of power modules, which solves the problem of abnormal oscillations at full-load power-on in overshoot tests of power modules and improves test efficiency

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  • Method and system for handling abnormal oscillation of power module overshoot test at full load power-on
  • Method and system for handling abnormal oscillation of power module overshoot test at full load power-on
  • Method and system for handling abnormal oscillation of power module overshoot test at full load power-on

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Embodiment Construction

[0044] In order to enable those skilled in the art to better understand the technical solutions in the present invention, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described The embodiments are only some of the embodiments of the present invention, not all of them. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts shall fall within the protection scope of the present invention.

[0045] figure 1 The method for handling the abnormal vibration of the power module in the overshoot test of the power module provided by the embodiment of the present application is composed of figure 1 As can be seen, the method of this embodiment includes the following steps:

[0046] S1. Connect the motherboard to be tested with a ...

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Abstract

The embodiment of the invention discloses a power-supply-module overshoot-test full-load power-on abnormal oscillation processing method and system and relates to the server power supply test field. The processing method comprises the following steps that a mainboard to be tested is connected to a load instrument and an oscilloscope; the load instrument is electrified, and the load pulling voltageof the load instrument is set to be a voltage value which is greater than 0V; and the load instrument pulls a full-load current, then the mainboard is electrified, the waveform of power supply moduleoutput voltage overshoot full load power on is grasped, and whether the waveform and the voltage value satisfy requirements is tested. By using the overshoot-test full-load power-on abnormal oscillation processing method and system, through setting the voltage value which is started to pull before the load instrument pulls the full-load current, the influence of a load instrument pull load current on the initial power on of a power supply module is avoided, a power-supply-module overshoot-test full-load power-on abnormal oscillation problem is effectively solved, the real work condition of the power supply module can be accurately reflected and test efficiency is increased.

Description

technical field [0001] The embodiments of the present invention relate to the field of server power supply testing, and in particular to a method and system for processing abnormal oscillations when the power supply module is fully loaded and powered on in an overshoot test. Background technique [0002] Server motherboards and other boards need to perform overshoot and undershoot tests on the power module during the development stage. The test waveform reflects the instantaneous impact of the output voltage of the power module on the circuit when it is turned on and off. Under normal circumstances, the waveforms of overshoot and undershoot should be monotonous, without sudden changes such as abnormal oscillations, and should meet the measurement range where the overshoot voltage value is less than 1.05 times the measured voltage and the undershoot voltage value is less than 300MV. [0003] The overshoot test requires power-on to capture waveforms under no-load and full-load...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R31/40
CPCG01R31/40
Inventor 隋鑫
Owner INSPUR SUZHOU INTELLIGENT TECH CO LTD