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Imperfect debugging software reliability model for fault detection rate reduction change

A technology for fault detection rate and reliability, applied in the field of imperfect debugging software reliability models, which can solve problems such as nonlinear changes

Active Publication Date: 2019-05-17
SHANXI UNIV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The third is that there are different degrees of dependence among the faults in the software.
Therefore, the number of faults introduced varies non-linearly with test time

Method used

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  • Imperfect debugging software reliability model for fault detection rate reduction change
  • Imperfect debugging software reliability model for fault detection rate reduction change
  • Imperfect debugging software reliability model for fault detection rate reduction change

Examples

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Embodiment 1

[0071] A reliability model for imperfect debugging software with decreasing variation of fault detection rate, comprising the following steps:

[0072] (1) The assumptions of the model are as follows:

[0073] ① During the software testing process, the fault detection and removal process obeys the non-homogeneous Poisson process;

[0074] ②The occurrence of software failure is caused by residual faults in the software;

[0075] ③ The fault detection rate gradually decreases with the test time;

[0076] ④ Each detected fault is removed immediately, and new faults may be introduced;

[0077] ⑤ The function of the total number of faults varies nonlinearly with the test time;

[0078] (2) According to the assumption ① in step (1), the non-homogeneous Poisson process can be expressed as:

[0079]

[0080] Among them, N(t) is a counting process, and {N(t),t>0}, m(t) represents the number of faults expected to be accumulated until time t;

[0081] According to the differentia...

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PUM

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Abstract

The invention belongs to the technical field of software reliability models, and particularly relates to an imperfect debugging software reliability model with the fault detection rate reduced and changed. The invention discloses an imperfect debugging software reliability model for fault detection rate reduction change. The imperfect debugging software reliability model comprises the following steps: (1) setting model assuming conditions; (2) according to the assumption in the step (1), obtaining an imperfect debugging software reliability module (shown in the description) of the fault detection rate reduction change. The invention adopts the above technology. The method has the advantages that the method is simple and easy to implement; According to the scheme, it is assumed that in thesoftware testing process, the fault detection rate is gradually decreased and changed along with the testing time, fault introduction is nonlinearly changed along with the testing time, and a corresponding software reliability model which is inperfectly debugged is provided.

Description

technical field [0001] The invention belongs to the technical field of software reliability models, and in particular relates to a software reliability model for imperfect debugging in which the fault detection rate drops and changes. Background technique [0002] Before software is released, software reliability assessment plays an important role. Because the user or customer always expects the released software to run without failure all the time. Once the running software fails, it will not only cause losses to users or customers, but also cause damage to the reputation of the software publishing company and high costs to repair the failure later. Therefore, before software testing is completed, project managers or managers always hope to be able to predict how many faults in the software to be released have not been detected. That is, how many bugs are left in the software. This seems like a simple question, but there is no useful information about the remaining fault...

Claims

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Application Information

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IPC IPC(8): G06F11/36
Inventor 王金勇
Owner SHANXI UNIV
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