Assembly and method for inspecting components
A technology for components and components, applied in the field of components with microcracks and other contaminants, can solve problems such as slowdown
Inactive Publication Date: 2019-08-06
ISMECA SEMICONDUCTOR HOLDING SA
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- Claims
- Application Information
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Problems solved by technology
Disadvantageously, this slows down existing components and methods for inspecting parts
Method used
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[0052] figure 1 A perspective view of an assembly 1 for inspecting a component 10 according to aspects of the invention is provided.
[0053] The assembly 1 comprises a camera 3 having a fixed position. Camera 3 may take any suitable form. Preferably, the camera 3 will be a high resolution camera that can capture images with a resolution of 4 megapixels, 8 megapixels, 9 megapixels, 12 megapixels or 29 megapixels. In a preferred embodiment, the camera 3 will be a high resolution camera that can capture images with a resolution between 5 and 12 megapixels.
[0054] Preferably, the camera 3 will have a lens with a 12.5:1 zoom.
[0055] The camera 3 will have a light source that can be used to illuminate the object being photographed. Preferably, the light source is configured to emit white light. However, in another embodiment, the camera 3 will be configured such that the user can select the type of light source used to illuminate the object being photographed; for example,...
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According to the present invention there is provided a method of inspecting a component (10), using an assembly comprising a camera (3) with a fixed position, and a moveable stage (5), wherein the moveable stage is configured such that it can rotate about a rotation axis (7), and, can move linearly along two linear axes (9a, 9b) wherein the two linear axes are perpendicular to one another and wherein both of the two linear axes are each perpendicular to the rotation axis, the method comprising the steps of, (a) providing a first component into a predefined orientation on the stage, such that afirst side of the component is facing a camera; (b) moving the stage linearly along one or more of the two linear axes so as to bring the first side of the first component into focus of the camera; (c) capturing an image of the first side of the first component after it has been brought into focus of the camera. An assembly according to the above comprising additionally a processor which is configured to determine whether the image of the component is in-focus of the camera, and if not, to determine a movement of the moveable stage and to initiate the moveable stage to undergo the determinedmovement so as to bring the component into focus is also provided.
Description
technical field [0001] The present invention relates to assemblies and methods for inspecting components, and in particular to assemblies and methods for inspecting components for microcracks and other contaminants, wherein a movable stage is moved to a predetermined position(s) to The different sides of the part move into focus of the camera. Background technique [0002] In existing assemblies and methods for inspecting parts, the part is placed into a predetermined location to be within the field of view of the camera; the camera then focuses on the part and captures an image of the part. The images are then inspected to identify any cracks or contamination in the part. When inspecting multiple parts, these preceding steps are repeated for each of the multiple parts, so for each part the camera is focused so that the part is in focus of the camera. Disadvantageously, this slows down existing assemblies and methods for inspecting parts. [0003] It is an object of the p...
Claims
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IPC IPC(8): G01N21/956H05K13/08
CPCG01N21/95684H05K13/0813G01N21/8851G01N2201/025G06T7/0002G06T2207/30108H04N7/183H04N23/54H04N23/64
Inventor J.帕拉特P.阿布瑞尔T.艾默
Owner ISMECA SEMICONDUCTOR HOLDING SA