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Sample introduction device

A sampling device and sample technology, applied in the field of analytical instruments, can solve problems such as large influence, difficult removal of water vapor, background affecting sample analysis, etc., to achieve the effects of improving accuracy and sensitivity and reducing background

Pending Publication Date: 2019-08-23
UNIV OF SCI & TECH OF CHINA
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  • Abstract
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  • Claims
  • Application Information

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Problems solved by technology

[0003] In the work of elemental analysis of samples by elemental analyzers, the samples are generally dropped directly from the sample tray into the elemental analyzer. Air and a small amount of moisture in the atmosphere are difficult to remove completely, especially powder samples are greatly affected
The impurities (i.e. air and moisture) adsorbed on the surface of these samples will directly affect the background of the sample analysis, and for some samples with low element content, it will seriously affect the accuracy and sensitivity of the analysis

Method used

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  • Sample introduction device

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Embodiment Construction

[0025] The invention provides a sample feeding device, which can significantly improve the precision and sensitivity of sample analysis by cooperating with an analyzer.

[0026] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0027] Such as figure 1 As shown, the embodiment of the present invention provides a sampling device, which is used to cooperate with the analyzer. The sampling device mainly includes: a body 11; a sample tray 1 arranged on the body 11, and the sample tray 1 is used for temporary Place the w...

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Abstract

The invention discloses a sample introduction device, which comprises a machine body, a sample tray, a moving member and a processing system, wherein the sample tray is arranged on the machine body; the moving member is arranged on the machine body and capable of moving on the machine body in a reciprocating manner, the moving member is provided with a transfer cavity, and the transfer cavity canreceive a sample sent by the sample tray and transfer the sample to an analyzer along with the movement of the moving member; and the processing system is arranged on the machine body and capable of performing helium purging and vacuum pumping on the sample in the transfer cavity. The sample introduction device can realize the automatic introduction of the sample through the relay transportation of the sample tray and the moving member for the sample. In addition, helium purging and vacuum pumping for the sample can be realized through the processing system in the sample transportation processof the moving member, thereby stripping substances such as air and water absorbed on the surface of the sample by means of helium purging, removing the stripped substances such as air and water absorbed on the surface of the sample by means of vacuum pumping, thus reducing the background of analysis to the greatest extent, and significantly improving the accuracy and sensitivity of elemental analysis and isotopic analysis.

Description

technical field [0001] The invention relates to the technical field of analytical instruments, in particular to a sampling device. Background technique [0002] In the pretreatment of elemental analysis and isotope analysis, the sampling device has a great influence on the precision and accuracy of the analysis. Therefore, a reasonably designed and efficient sampling device is essential in the analysis of the elemental content and isotopic composition of the sample. important. [0003] In the elemental analysis of samples by elemental analyzers, the samples are generally dropped directly from the sample tray into the elemental analyzer. Air and a small amount of moisture in the atmosphere are difficult to remove completely, especially powder samples are greatly affected. The impurities (ie, air and moisture) adsorbed on the surface of these samples will directly affect the background of the sample analysis, and for some samples with low element content, it will seriously a...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H01J49/04
CPCH01J49/0413H01J49/0422G01N30/7206G01N2035/0441G01N2035/0465G01N35/04G01N1/34
Inventor 龚冰郑永飞
Owner UNIV OF SCI & TECH OF CHINA
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