Method for testing internal stray radiation of thermal infrared spectrometer

A technology of thermal infrared spectroscopy and stray radiation, which is applied in the field of testing stray radiation of thermal infrared spectrometers, can solve problems affecting system radiation accuracy and system quantification, and achieve simple methods for solving system radiation accuracy and system quantification Effect

Inactive Publication Date: 2019-09-13
SHANGHAI INST OF TECHNICAL PHYSICS - CHINESE ACAD OF SCI
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Problems solved by technology

[0005] The purpose of the present invention is to propose a test method for the internal stray radiation of the thermal infrared spectrometer system in order to solve the problem that the internal stray radiation calibration of the thermal infrared spectrometer seriously affects the system radiation accuracy and system quantification in practical engineering applications

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  • Method for testing internal stray radiation of thermal infrared spectrometer
  • Method for testing internal stray radiation of thermal infrared spectrometer
  • Method for testing internal stray radiation of thermal infrared spectrometer

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Embodiment Construction

[0029] In order to make the purpose, features and advantages of the present invention clearer, a specific implementation of the present invention will be described in more detail below in conjunction with the accompanying drawings and embodiments. In the following description, many specific details are set forth. In order to fully understand the present invention, the present invention can be implemented in many other ways than described, therefore, the present invention is not limited by the specific embodiments disclosed below.

[0030] We take the thermal infrared spectrometer measuring the Offner structure as an example, the optical structure of the thermal infrared spectrometer is as follows figure 2 Shown, according to the test method of the internal stray radiation of the thermal infrared spectrometer described in the present invention, a specific implementation is given.

[0031] Such as image 3 As shown, the black body 1 is used to calibrate the detector 2 separate...

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Abstract

The invention discloses a method for testing internal stray radiation of a thermal infrared spectrometer. A radiation test is respectively performed on a full response band of a detector and a spectral channel of the thermal infrared spectrometer at an integration time by using a black body, an equivalent gray value and radiant flux of the internal stray radiation in the current state of the system can be measured by respectively performing a test on the detector and the spectrometer via the method, and the gray value and the radiant flux of the the internal stray radiation of the thermal infrared spectrometer at any integration time and any optical machine temperature can be obtained in combination with the optical machine temperature during the test. The method disclosed by the inventionis simple, can be used for effectively solving the problem that the internal stray radiation of the thermal infrared spectrometer seriously affects the system radiation precision and the system quantification, and is suitable for practical engineering applications.

Description

technical field [0001] The invention relates to the field of quantitative testing of remote sensing instruments, in particular to a testing method for stray radiation of a thermal infrared spectrometer. Background technique [0002] During the spectral splitting process of thermal infrared spectrometer, the signal light is divided into dozens to hundreds of bands. Due to the strong internal stray radiation generated by the radiation of the optical machine itself, the signal intensity is weaker than that of traditional imaging instruments, resulting in system signal noise. Ratio, the effective dynamic range is small, and the exposure time is difficult to increase; and the internal stray radiation increases with the increase of temperature, which seriously affects the system radiation accuracy and system quantification. Therefore, the measurement and calibration of the internal stray radiation of the thermal infrared spectrometer is particularly important for the research of t...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01J3/28
CPCG01J3/2823G01J2003/2866
Inventor 刘银年彭俊何琦张营王伯海孙德新
Owner SHANGHAI INST OF TECHNICAL PHYSICS - CHINESE ACAD OF SCI
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