A floating gate type field effect transistor memory and its manufacturing method

A field-effect transistor and memory technology, applied in the field of memory, can solve the problems of reducing memory performance and the effect of memory erasing and writing is not obvious, and achieve the effect of high mechanical strength, high mechanical strength, and strong oxidation resistance

Active Publication Date: 2021-09-28
HUAZHONG UNIV OF SCI & TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0004] To sum up, in the above-mentioned work of improving floating gate memory by using two-dimensional materials, most of them are not very obvious in improving the effect of memory erasing and writing. Other properties of

Method used

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  • A floating gate type field effect transistor memory and its manufacturing method
  • A floating gate type field effect transistor memory and its manufacturing method
  • A floating gate type field effect transistor memory and its manufacturing method

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Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0039] The technical solutions of the present invention will be further described below in conjunction with the accompanying drawings and through specific implementation methods.

[0040] For better illustrating the present invention, facilitate understanding technical scheme of the present invention, typical but non-limiting embodiment of the present invention is as follows:

[0041] 1. Materials, reagents and instruments

[0042] Table 1-1 Main reagent information of the experiment

[0043]

[0044] Table 1-2 Experimental instruments and equipment

[0045]

[0046] 2. Device construction process

[0047] (1) Fabrication of silicon wafer substrate

[0048] In this experiment, a silicon oxide wafer with an oxide layer thickness of 90 nm was used as the substrate of the device. In order to facilitate the fabrication of the device, it was first necessary to cut the silicon wafer into 2 × 2 cm 2 A small square silicon wafer, and then cleaned to obtain a clean surface. ...

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Abstract

The invention relates to a floating gate type field effect transistor memory with fast erasing and writing of data and a manufacturing method thereof, belonging to the technical field of memory; in the prior art, it is not very obvious to improve the effect of memory erasing and writing; the invention provides A kind of memory, the memory uses a silicon wafer with a silicon oxide layer as a substrate, and the memory is successively from the substrate to a few-layer graphene as a floating gate layer, and hexagonal boron nitride as an insulating layer, as New two-dimensional materials (platinum disulfide and rhenium disulfide) for the channel layer, the memory also includes source and drain electrodes formed by evaporation on the channel layer; while realizing fast writing of data, it also realizes fast erasing of memory data.

Description

technical field [0001] The invention relates to the technical field of memory, in particular to a floating gate type field effect transistor memory with fast erasing and writing of data and a manufacturing method thereof. Background technique [0002] At present, with the advent of the big data era, memory is the key to ensuring that computers perform information processing and memory tasks. There are many types of memory, which can be roughly divided into two categories: volatile memory and non-volatile memory. Volatile memory is represented by dynamic random access memory (DRAM) and static random access memory (SRAM), which have extremely fast data writing However, after the system is powered off, the data in this type of memory cannot be stored for a long time (less than 1 ms). Therefore, this type of memory is mainly used in computer systems Memory; in contrast to the non-volatile memory represented by flash memory (FLASH), the data stored in it can be effectively saved...

Claims

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Application Information

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Patent Type & AuthorityPatents(China)
IPC IPC(8): H01L29/10H01L29/24H01L29/49H01L29/51H01L29/788H01L21/34H01L27/11521H10B41/30
CPCH01L29/788H01L29/1083H01L29/49H01L29/518H01L29/24H01L29/66969H10B41/30
Inventor诸葛福伟余军翟天佑陈玉倩
OwnerHUAZHONG UNIV OF SCI & TECH