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Display panels and test systems

A technology for display panels and test terminals, which is used in instruments, nonlinear optics, optics, etc., and can solve the problem that the display panel cannot detect that the impedance of metal traces increases or even breaks.

Active Publication Date: 2022-05-31
WUHAN CHINA STAR OPTOELECTRONICS TECH CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] The present invention provides a display panel and a test system, which are used to solve the technical problem that the existing display panel cannot detect that the impedance of metal traces becomes larger or even broken

Method used

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  • Display panels and test systems
  • Display panels and test systems
  • Display panels and test systems

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Embodiment Construction

[0031] The following description of the embodiments is made with reference to the accompanying drawings to illustrate specific implementations in which the invention may be practiced

[0032] The present invention is directed to the technical problem that the existing display panel cannot detect that the impedance of the metal wiring becomes large or even breaks,

[0033] As shown in FIG. 1, the lower frame 11 of the existing display panel includes a binding area 112, and the binding area is provided with a metal guide

[0034] As shown in FIG. 3, an embodiment of the present invention provides a display panel, the display panel 2 includes a binding area 22, located in the

[0035] As shown in FIG. 3 and FIG. 4, an embodiment of the present invention provides a display panel, the display panel includes a binding area 22 and a bit

[0037] The thin film transistor 232 is disposed on the substrate 211, and is etched to form a metal trace 25, at least one of the gold

[0038] The plan...

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PUM

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Abstract

The present invention provides a display panel and a test system. The display panel includes a binding area and buffer areas located on both sides of the binding area. The display panel includes a substrate, a thin film transistor, a planarization layer, a passivation layer and The test terminal is formed by forming a second via hole and a third via hole in the buffer zone on the planarization layer and the passivation layer respectively, so that the test terminal is connected to both ends of the metal trace through the second via hole and the third via hole , so that the metal wiring can be tested through the test terminal, and the state of the metal wiring can be obtained accordingly, which solves the technical problem that the existing display panel cannot detect that the impedance of the metal wiring increases or even breaks.

Description

Display panels and test systems technical field [0001] The present invention relates to the field of display technology, in particular to a display panel and a test system. Background technique [0002] In the lower frame of the display panel, the wiring of the binding area is as shown in FIG. In order to bind the flexible circuit board to the display panel, it is necessary to dig the insulating layer of the binding area so that the metal traces are connected to the IC and the flexible circuit. The terminal connection of the board, as shown in Figure 2, is due to the excavation of the planarization layer of the bonding area, so that before the passivation layer is deposited, the gold in the bonding area is If the metal trace is exposed to the outside world, it will cause the metal trace to be corroded, causing the impedance of the metal trace to increase or even the metal trace to be corroded. The wiring is broken, causing the display panel to have a problem of poor di...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G02F1/1362G02F1/13
CPCG02F1/136259G02F1/1309G02F1/136254
Inventor 戴荣磊
Owner WUHAN CHINA STAR OPTOELECTRONICS TECH CO LTD