Unlock instant, AI-driven research and patent intelligence for your innovation.

Display panel and test system

A technology for display panels and test terminals, which is applied in nonlinear optics, instruments, optics, etc., and can solve the problem that the display panel cannot detect that the impedance of metal traces increases or even breaks.

Active Publication Date: 2020-02-28
WUHAN CHINA STAR OPTOELECTRONICS TECH CO LTD
View PDF4 Cites 8 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] The present invention provides a display panel and a test system, which are used to solve the technical problem that the existing display panel cannot detect that the impedance of metal traces becomes larger or even broken

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Display panel and test system
  • Display panel and test system
  • Display panel and test system

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0031] The following descriptions of the various embodiments refer to the accompanying drawings to illustrate specific embodiments in which the invention may be practiced. The directional terms mentioned in the present invention, such as [top], [bottom], [front], [back], [left], [right], [inside], [outside], [side], etc., are only for reference The orientation of the attached schema. Therefore, the directional terms used are used to illustrate and understand the present invention, but not to limit the present invention. In the figures, structurally similar elements are denoted by the same reference numerals.

[0032] The present invention aims at the technical problem that the existing display panel cannot detect the increase or even breakage of the metal wiring impedance, and the embodiments of the present invention are used to solve this problem.

[0033] Such as figure 1 As shown, the lower frame 11 of the existing display panel includes a binding area 112, and a metal w...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention provides a display panel and a test system. The display panel comprises a binding area and buffer areas located on the two sides of the binding area. The display panel comprises a substrate, a thin film transistor, a planarization layer, a passivation layer and test terminals; a second via hole and a third via hole are respectively formed in the buffer areas on the planarization layer and the passivation layer, so that the test terminals are connected with the two ends of a metal wire through the second via hole and the third via hole, and the metal wire can be tested through thetest terminals, thereby obtaining the state of the metal wire correspondingly, and solving the technical problem that an existing display panel cannot detect that the impedance of the metal wire is increased or even broken.

Description

technical field [0001] The invention relates to the field of display technology, in particular to a display panel and a test system. Background technique [0002] In the lower border of the display panel, the routing of the binding area is as follows figure 1 As shown, since the IC and the flexible circuit board need to be bound to the display panel in the bonding area, the insulating layer of the bonding area needs to be dug out so that the metal traces are connected to the terminals of the IC and the flexible circuit board, such as figure 2 As shown, due to the digging of the planarization layer in the bonding area, the metal traces in the bonding area are exposed to the outside world before the passivation layer is deposited, which will cause the corrosion of the metal traces and cause the impedance of the metal traces It becomes larger or even the metal wire breaks, causing the display panel to have a problem of poor display effect. [0003] Therefore, the existing di...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G02F1/1362G02F1/13
CPCG02F1/136259G02F1/1309G02F1/136254
Inventor 戴荣磊
Owner WUHAN CHINA STAR OPTOELECTRONICS TECH CO LTD