Method for inspecting the insertion state of a plurality of pins inserted into a substrate, and substrate inspection device
A substrate inspection and insertion state technology, applied in measurement devices, circuit inspection/identification, instruments, etc., can solve the problems of poor pin insertion, large time and cost, cost and time consumption, etc., to improve poor insertion and efficient control. Effect
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[0049] The embodiments of the present disclosure are exemplarily proposed for the purpose of explaining the technical idea of the present disclosure. The scope of rights of the present disclosure is not limited to the examples presented below or the specific descriptions of these examples.
[0050] Unless defined differently, all technical and scientific terms used in this disclosure have the same meaning as commonly understood by one of ordinary skill in the art to which this disclosure belongs. All terms used in the present disclosure are selected for the purpose of more clearly explaining the present disclosure and not for the purpose of limiting the right scope of the present disclosure.
[0051] Expressions such as "comprising", "having", "having", etc. used in the present disclosure should be understood to have the possibility of including other embodiments as long as they are not mentioned differently in the sentences or articles containing the corresponding expressio...
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