Method for predicting learning achievements by correcting scores of simple answer

A technology for short-answer questions and results, applied in forecasting, instrumentation, data processing applications, etc., to solve problems such as analysis and forecasting models for few short-answer questions, complex short-answer questions, and no disclosure of how to analyze the mastery of knowledge points.

Inactive Publication Date: 2020-08-14
NANCHANG CAMPUS OF JIANGXI UNIV OF SCI & TECH
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Problems solved by technology

CN104809677A discloses an automatic marking method based on statistics and analysis of knowledge point mastery, the method mainly involves the step of marking papers, and does not disclose how to analyze knowledge point mastery
[0004] In addition, compared with fill-in-the-blank questions and multiple-choice questions, the question structure of short-answer questions i

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  • Method for predicting learning achievements by correcting scores of simple answer
  • Method for predicting learning achievements by correcting scores of simple answer
  • Method for predicting learning achievements by correcting scores of simple answer

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Embodiment Construction

[0025] In order to make the purpose, technical solutions and advantages of the embodiments of the present invention more clear, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention.

[0026] Such as figure 1 The method for predicting learning outcomes by modifying the scores of short-answer questions of the present invention is used to predict learning outcomes based on the scores of a test paper containing multiple short-answer questions. Such test papers are, for example, subjective questions of judicial examinations. It mainly includes the following steps:

[0027] Determine the total length of the quiz . The total test time refers to the total test time of the test paper, representing the maximum allowed answering time for all short-answer questions, for example, 2 hours or 3 hours. Before the test, the operator allocates the total...

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Abstract

The invention discloses a method for predicting learning achievements by correcting scores of simple answers. According to the method, an answering set is determined according to a score list, a firstprofile in a first question bank is called, a second profile in a second question bank is called, and a test question adjustment coefficient of each test question and a correction score of each question and answer identifier are determined; and finally, a learning achievement of each knowledge point code is determined according to the question and answer score and the correction score. Accordingto the invention, the mastery degree of the answerer for each question and answer knowledge point is determined through the corrected test paper score, so that the learning result can be predicted more accurately. Learning achievements of a unified class or a plurality of students in the same major are summarized, and teaching quality can be evaluated.

Description

technical field [0001] The invention relates to a method for predicting learning outcomes by correcting scores of short-answer questions, which belongs to the processing and prediction technology of subject achievement data. Background technique [0002] CN110929020A discloses a knowledge point mastery analysis method based on test scores. This method systematically disperses different knowledge points into different test questions, and combines the students' right and wrong test questions to form a knowledge point master database for each student. In the specific test, the test content is generated into a question number and a knowledge point number is generated for each knowledge point, and the knowledge point mastery level is analyzed for each student's test question test results. The calculation formula for knowledge point mastery in this case takes into account the degree of difficulty of knowledge points and the ability of students, but does not take into account the ...

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Application Information

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IPC IPC(8): G06Q10/04G06Q10/06G06Q50/20
CPCG06Q10/04G06Q10/06395G06Q50/205
Inventor 兰新华
Owner NANCHANG CAMPUS OF JIANGXI UNIV OF SCI & TECH
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