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Probe

A probe and elastomer technology, applied in the field of probes, can solve problems such as the position deviation of the terminal and the center conductor, and the accuracy of characteristic inspection is easily reduced, and achieve the effect of high-precision characteristic inspection

Pending Publication Date: 2021-07-23
MURATA MFG CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Like the probe of Patent Document 1, when a plurality of center conductors are brought into contact with a plurality of terminals at the same time, positional displacement between the terminals and the center conductors occurs, and the accuracy of characteristic inspection tends to decrease.

Method used

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Examples

Experimental program
Comparison scheme
Effect test

Embodiment approach 1

[0048] Figure 1-Figure 3 It is a figure showing the schematic structure of the probe 2 in Embodiment 1. figure 1 is a perspective view of probe 2, figure 2 is the side view of probe 2, image 3 is a longitudinal sectional view of the probe 2 .

[0049] The probe 2 is an inspection tool for inspecting the characteristics of the connector 3 . The connector 3 of Embodiment 1 is a multi-pole connector having a plurality of terminals. The probe 2 includes a plunger 4 , a coaxial cable 6 , a flange 8 , a case 9 , a first elastic body 10 , a second elastic body 12 , and a measurement connector 13 .

[0050] The plunger 4 has a first plunger 14, a second plunger 16, a third plunger 23 ( image 3 ). The first plunger 14 , the second plunger 16 , and the third plunger 23 are all components attached to the periphery of the casing 9 .

[0051] The first plunger 14 is a member that separates the first elastic body 10 and the second elastic body 12 . Such as image 3 As shown, th...

Embodiment approach 2

[0108] use Figure 11 ~ Figure 16B The probe 40 according to Embodiment 2 of the present invention will be described. In addition, in Embodiment 2, points different from Embodiment 1 will be mainly described. In addition, the same code|symbol is attached|subjected to the same or equivalent structure, and description is abbreviate|omitted.

[0109] First, use Figure 11-Figure 12B The structure of the probe 40 will be described. Figure 11 It is a side view of the probe 40 of Embodiment 2, Figure 12A is a longitudinal sectional view of the probe 40, Figure 12B yes Figure 12A A partial enlargement of the .

[0110] The probe 40 of the second embodiment is mainly different from the probe 2 of the first embodiment in that the first elastic body 42 is disposed outside the second elastic body 44 .

[0111] Such as Figure 12A As shown, the first elastomeric body 42 and the second elastomeric body 44 are separated by a first plunger 46 . The first plunger 46 has a partiti...

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Abstract

This probe for connector-characteristic inspection comprises a flange, housing, first plunger, first elastic body, second plunger, and second elastic body. In the bottom of the second plunger, an opening is formed that allows the passage therethrough of a probe pin that is electrically connected to a coaxial cable. The second plunger is capable of moving between a first position where the distal end of the probe pin is made to protrude from the opening and a second position where the distal end of the probe pin is disposed closer to the side of a proximal part than the opening. The first elastic body and second elastic body are disposed so as to partially overlap each other in the axial direction of the housing. The first plunger has a partitioning wall for partitioning the locations where the first elastic body and second elastic body overlap.

Description

technical field [0001] The present invention relates to a probe for performing a characteristic inspection of a connector. Background technique [0002] Conventionally, a probe for performing a characteristic inspection of a connector as an object to be inspected has been disclosed (for example, refer to Patent Document 1). [0003] The probe of Patent Document 1 is a probe for performing a characteristic inspection of a coaxial connector, particularly a multipolar connector provided with a plurality of terminals so that a plurality of signals flow therethrough. The probe of Patent Document 1 includes a plurality of central conductors capable of simultaneously contacting a plurality of terminals of a multipolar connector. [0004] Patent Document 1: International Publication No. 2016 / 072193 [0005] In connector probes, it is required to improve the accuracy of terminal characteristic inspection. Like the probe of Patent Document 1, when a plurality of center conductors a...

Claims

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Application Information

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IPC IPC(8): G01R1/067
CPCG01R1/067
Inventor 小出知明
Owner MURATA MFG CO LTD
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