Method for rapidly identifying shallow lake sediment pollution layering information through shallow cutting

A sediment and bottom sediment technology, applied in the measurement of color/spectral characteristics, etc., can solve the problem of difficult to quickly identify the lake sediment pollution stratification information, etc., to shorten the analysis time and improve the stratification accuracy.

Active Publication Date: 2021-08-06
CHINA UNIV OF GEOSCIENCES (WUHAN)
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Problems solved by technology

[0003] In the prior art, the sediment survey is mainly used to calibrate and verify the results of the shallow profile. After the analysis and measurement of the pollutant content, only its variation characteristics with depth can be obtained. Without combining the two, it is difficult to quickly identify the pollution of lake sediments. hierarchical information

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  • Method for rapidly identifying shallow lake sediment pollution layering information through shallow cutting
  • Method for rapidly identifying shallow lake sediment pollution layering information through shallow cutting
  • Method for rapidly identifying shallow lake sediment pollution layering information through shallow cutting

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Embodiment Construction

[0028] The present invention will be further described below in conjunction with drawings and embodiments.

[0029] The invention provides a method for quickly identifying shallow lake sediment pollution stratification information by shallow profile, comprising the following steps:

[0030] S1. Superficial section device scan:

[0031] Use a shallow profile device to scan the thickness of the lake bottom sediment silt to obtain shallow profile data. During the scanning process, the ship equipped with the shallow profile equipment travels in the direction of the end face and the center line; No more than 20 meters.

[0032] S2. Columnar sample collection:

[0033] During the scanning process with the shallow section device, the gravity sediment sampler is used to collect the bottom columnar samples along the shallow section scanning direction.

[0034] S3. Columnar sample analysis:

[0035] Analyze the collected underwater columnar samples, measure the water content and nut...

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Abstract

The invention provides a method for rapidly identifying shallow lake sediment pollution layering information through shallow cutting. The method comprises the following steps of: scanning by a shallow cutting device, collecting a columnar sample, analyzing the columnar sample and linear correlation, and finally drawing a contour map to obtain a sediment pollution layering result. According to the method for rapidly identifying the shallow lake sediment pollution layering information through shallow cutting, on the basis of shallow cutting scanning and columnar sample pollutant determination, linear correlation analysis of the water content and the pollutant content of the sediment in each layer is added, so that the pollution layering information of the sediment in the lake is rapidly identified through shallow cutting.

Description

technical field [0001] The invention relates to a method for quickly identifying layered information of sediment pollution in shallow lakes by shallow profile, and belongs to the technical field of water body surveying and mapping. Background technique [0002] In recent years, the rapid development of regional economy has caused water pollution and other problems to become increasingly prominent. Urban and rural domestic wastewater, industrial and agricultural wastewater, and livestock and poultry breeding wastewater have caused surface water quality in rivers and lakes to be polluted, and the water body is characterized by eutrophication. A large amount of exogenous pollution enters the water body and finally accumulates in the sediment through settlement and diffusion. Under certain conditions, the pollutants in the sediment will be released to the overlying water body and become the endogenous pollution of the water body. After exogenous pollution has been effectively co...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/31G01N21/33
CPCG01N21/31G01N21/33
Inventor 李立青李成瑶廖桂英张伟军沈翔王东升
Owner CHINA UNIV OF GEOSCIENCES (WUHAN)
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