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Pick-up-device testing apparatus

An inspection device and pick-up technology, which is applied in the direction of measuring devices, instruments, optical instrument testing, etc., can solve the problems of increasing production costs, reducing inspection efficiency, and increasing time and labor.

Inactive Publication Date: 2004-06-30
SAMSUNG ELECTRONICS CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0013] However, the conventional pickup inspection device 101 only inspects one pickup 110 in each inspection process, which consumes relatively much time and labor in order to inspect many pickups 110, thus reducing inspection efficiency, and because of low efficiency and will increase production costs

Method used

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Examples

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Embodiment Construction

[0030] Embodiments of the present invention will be described in detail below, wherein the same reference numerals correspond to the same elements. The following description of the embodiments is to illustrate the present invention by referring to the figures.

[0031] Such as Figures 4 to 6 As shown, the pickup inspection device 1 according to the embodiment of the present invention includes: a disk drive unit 30, which supports and rotates a disk 3 with predetermined data, to check the performance of the pickup 10; a pickup transfer unit 20, which holds the pickup 10, and transfer the pickup 10 to the disk drive unit 30 to read the data recorded on the disk 3. The pickup inspection device 1 includes four pickup transfer units 20 corresponding to one disk drive unit 30 , so that four pickups 10 can be inspected simultaneously.

[0032] Pick-up 10 comprises: the photodiode (not shown) that emits laser beam; In the disk drive, read data from and write data to the disk 3 arran...

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PUM

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Abstract

A pickup inspecting apparatus inspecting performance of a pickup to be mounted on a disk drive and reading data from a disk includes a disk driving unit rotatably supporting a disk, and a plurality of pickup transferring units disposed around the disk driving unit and each holding the pickup and transferring the pickup to the disk driving unit so as to read data recorded on the disk, so that a plurality of pickups are inspected at once. An inspection efficiency of the pickup inspecting unit is improved.

Description

technical field [0001] The present invention relates to a pickup inspection device, and more particularly to a pickup inspection device for inspecting the performance of a pickup installed in a magnetic disk drive and reading data from a magnetic disk. Background technique [0002] Typically, disk drives such as CD-ROM (Compact Disc Read Only Memory) drives, CD-RW (Compact Disc Rewritable) drives, DVD (Digital Video Disc) data input. The pickup includes a photodiode that emits a laser beam, an adjuster mounted with an objective lens that focuses the laser beam emitted by the photodiode on a magnetic disk, and the like. [0003] In the process of manufacturing the pick-up, after the pick-up is assembled, the performance of the pick-up is checked by the pick-up inspection device. [0004] Figures 1 to 3 A conventional picker inspection device 101 is shown. Such as Figures 1 to 3 As shown, the picker inspection device 101 includes: a picker holder 121 for holding the picke...

Claims

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Application Information

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IPC IPC(8): G11B7/22
CPCG11B7/22
Inventor 朴喆洙郑在贤田炳焕奇钟日
Owner SAMSUNG ELECTRONICS CO LTD