Multilayer capacitor, manufacturing method thereof

a manufacturing method and capacitor technology, applied in the field of multi-layer capacitors, can solve the problems of increasing the difficulty the difficulty of keeping the fluctuation of the power source voltage within tolerances, and the speed and size of the fluctuation of the load current, so as to achieve the effect of reducing the esl and the manufacturing method thereo

Active Publication Date: 2008-05-01
TDK CORPARATION
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Benefits of technology

[0019]According to the multilayer capacitor of the present invention, in an external layer portion, a first external conductor layer and a second external conductor layer are stacked via said dielectric layer which are not overlapping in stacking direction. Thus, in case that electric-potential of the first terminal electrode is higher than that of the second terminal electrode, from the first terminal electrode to the first external conductor layer, the electric current flows separately, and the electric current flows from the second external conductor layer into the second terminal electrode. On the other hand, in case that electric-potential of the second terminal electrode is higher than that of the first terminal electrode, from the second terminal electrode to the second external conductor layer, the electric current flows separately, and the electric current flows from the first external conductor layer into the first terminal electrode. As stated above, in any cases, by making the electric flow separately which flows from each terminal electrode to conductor layer, the ESL of whole multilayer capacitor can be reduced. Additionally, as a result of the fact that the external layer portion includes pluralities of first and second external conductor layers respectively, the effect of separately flowing the electric current from each terminal electrode to an external conductor layer can be increased. Namely, pluralities of the first external conductor layers and the second external conductor layers perform as a plurality of inductor components connected to each terminal electrode in parallel, so that the ESL of whole body of the multilayer capacitor can be reduced.
[0039]As a result, it is possible to prevent exposing each of internal conductor layers and each of external conductor layers on the first side face and the second side face of the dielectric body, so that it is possible to prevent deterioration (oxidization) of each of the internal conductor layers and each of the external conductor layers.

Problems solved by technology

Therefore, it has become extremely difficult to keep fluctuations in the power source voltage to within tolerances when faced with rapid changes in the load current.
Along with the increasingly higher operating frequencies of today's CPU's, however, the fluctuations in the load current have become faster and larger.
However, it has been required to further reducing the ESL.
However, in the two terminal capacitor of the JP Unexamined Patent Publication No. 2006-60147, the effects of reducing the ESL cannot be obtained sufficiently because the metallic particles are used for preventing peeling of terminal electrodes.

Method used

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  • Multilayer capacitor, manufacturing method thereof
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  • Multilayer capacitor, manufacturing method thereof

Examples

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example

[0173]Next, the present invention will be further explained based on specific example, but the present invention is not limited to this example. In the present example, the ESL of the respective capacitor samples has been found by converting from S parameter to impedance by using impedance analyzer.

[0174]Firstly, each capacitor sample is explained. A multi-terminal type multilayer capacitor according to the embodiment as shown in FIG. 1 is a sample Ex1. Further, a capacitor formed in the same way as in the sample Ex1 other than not comprising pin hole conducting portions 20 is a sample Cex1. The ESL of each sample was measured.

[0175]As a result of this, impedance property of each sample was measured. The results are shown in FIG. 6. As shown in a chart of FIG. 6, at a high frequency side, it was confirmed that a value of impedance of the sample Ex1 becomes smaller than that of the sample Cex1. Further, when measuring the ESL, the sample Ex1 shows 27 pH, and the sample Cex1 shows 35 ...

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Abstract

A multilayer capacitor 10 comprising a dielectric body 12 formed by stacking a plurality of dielectric layers 12a and 12b having an approximately rectangular parallelepiped shape; an internal layer portion 17 in which pluralities of first internal conductor layers 21 and second internal conductor layers 22 to be set at different electric potentials each other are stacked alternately in said dielectric body 12 via said dielectric layer 12a as mutually overlapping in stacking direction Z to form an internal electrode circuit of a capacitor; an external layer portion 19a and 19b in which pluralities of first external conductor layers 23 and second external conductor layers 25 to be set at different electric potentials which are not overlapping in stacking direction Z, are stacked in said dielectric body 12 via said dielectric layer 12b, the external layer portions being adjacent to at least any of both end faces of said internal layer portion 17 in stacking direction Z; and a first terminal electrode 31 and a second terminal electrode 32 to be set at different electric potentials each other are formed at least on a side face parallel to stacking direction Z of side faces of said dielectric body. Each of the first terminal electrodes 31 are connected with at least one of said first internal conductor layer 21 and a plurality of said first external conductor layers 23; and each of the second terminal electrodes 32 are connected with at least one of said second internal conductor layer 22 and a plurality of said second external conductor layers 25. The dielectric layer 12b positioned at said external layer portions 19a and 19b comprises, in an area of overlapping a pair of said first external conductor layers 23 or a pair of said second external conductor layers 25 adjacent to said dielectric layer 12b, a plurality of pin hole conducting portions 20 connecting a pair of said first external conductor layers 23 or a pair of said second external conductor layers 25 each other adjacent to said dielectric layer 12b, in stacking direction Z.

Description

BACKGROUND OF THE INVENTION[0001]1. Field of the Invention[0002]The present invention relates to multilayer capacitor greatly reducing the equivalent serial inductance (ESL) and production method thereof, more particularly relates to a multilayer capacitor used as a decoupling capacitor and manufacturing method thereof.[0003]2. Description of the Related Art[0004]In recent years, while advances have been made in reducing the voltage of power sources used for supplying power to large-scale integrated circuits (LSI's) and other integrated circuits, the load current has increased.[0005]Therefore, it has become extremely difficult to keep fluctuations in the power source voltage to within tolerances when faced with rapid changes in the load current. Therefore, a decoupling capacitor (for example two-terminal structure multilayer ceramic capacitor) is now being connected to a power source. At the time of transitory fluctuation in the load current, current is supplied from this multilayer...

Claims

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Application Information

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IPC IPC(8): H01G4/30H01G4/12H01G7/00H01G2/00H01G4/232
CPCH01G4/005Y10T29/43H01G4/30H01G4/232H01G13/00
InventorTOGASHI, MASAAKI
OwnerTDK CORPARATION