Method for carrying out substratum correlation for logging curve by using wavelet pair of Mexico cap
A technology of logging curves and layer comparison, which is applied in the fields of electrical/magnetic detection for logging records, re-radiation of sound waves, radio wave measurement systems, etc. give comparative information, etc.
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[0039] The method of the present invention is described in detail below in conjunction with accompanying drawing:
[0040] The spontaneous potential curves of two wells are selected as well logging curves, and they are sampled at certain intervals. The sampling at different intervals reflects the different morphological characteristics of the curves. The log curve is firstly subjected to Fourier transform to obtain the frequency distribution range of the two curves [f min , f max ], according to this frequency range discrete wavelet transform scale factor:
[0041]
[0042]
[0043] The Mexican hat wavelet is defined as:
[0044] Ψ ( t ) = 2 3 π 1 / 4 ( 1 - t 2 ) ...
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