Method and system for parallel testing

A technology of test unit and test module, which is applied in the fields of electrical components, wireless communication, connection management, etc., can solve the problems of failure to reflect the advantages of TD-SCDMA technology, disadvantageous improvement of receiver index test accuracy, and failure to make full use of physical channels Time-division multiplexing and other issues to achieve the effect of reducing repetitive preparation work, improving test efficiency, and improving test efficiency

Inactive Publication Date: 2010-03-31
DATANG MOBILE COMM EQUIP CO LTD
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Problems solved by technology

[0016] First, the test efficiency is low, especially not conducive to the needs and guarantee of mass production testing
Since all test items are sequentially tested one by one, the test time is equal to the sum of all test items, resulting in a long test time and restricting the addition of new test items, which is not conducive to improving the coverage of the test
[0017] In the second aspect, the advantages of time division multiplexing of physical channels of the TD-SCDMA system cannot be fully utilized, so that the technica...

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Embodiment Construction

[0032] The core idea of ​​the present invention is: based on the time division duplex characteristics of the TD-SCDMA system, the parallel test mechanism of time division duplex is introduced, and then the mechanism of multi-time slot parallel building chain is adopted at the same time, by improving the utilization rate of physical channel resources, to improve Improve the test efficiency of the whole machine and shorten the test time.

[0033] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be further described in detail by citing the following embodiments and referring to the accompanying drawings.

[0034] A parallel testing method includes two schemes. The first solution is to use a time-division duplex parallel test mechanism to perform parallel tests on at least two types of indicators in the uplink receiver indicator, downlink transmitter indicator, and functional indicators. The second solutio...

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Abstract

The invention discloses a method for parallel testing, which comprises the step of: adopting a time division duplex parallel testing mechanism to perform the parallel test on at least two of an uplinkreceiver index, a downlink emitter index and a functional index. The invention also discloses a system for the parallel testing, which comprises a testing unit used for adopting the time division duplex parallel testing mechanism to perform the parallel test on the at least two of the uplink receiver index, the downlink emitter index and the functional index. The method and the system in the invention can improve the utilization ratio of channel resources, the testing efficiency and the testing accuracy.

Description

technical field [0001] The invention relates to parallel test technology, in particular to a method and system for parallel test of uplink and downlink indicators based on TD-SCDMA system time division duplex characteristics. Background technique [0002] At present, the existing TD-SCDMA system whole machine test scheme is to test the base station whole machine test items. The base station machine test items include transmitter indicators, receiver indicators and functional indicators of the base station. Among them, the transmitter index and receiver index are determined according to the test items and test items shown in Table 1 below, and the functional index is determined by the design or manufacturer according to the product characteristics. [0003] [0004] Table 1 [0005] As far as the existing TD-SCDMA system test plan is concerned, compared with the test plan of the WCDMA system, the test plan of the existing TD-SCDMA system for the test items of the base st...

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Application Information

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IPC IPC(8): H04W24/00H04W76/02H04W76/06
Inventor 吴承峰王金石段春虎
Owner DATANG MOBILE COMM EQUIP CO LTD
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