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Improved electronic component handler test plate

A technology for electronic components and test boards, applied in the field of electronic component processing devices, can solve the problems of increasing complexity and cost, increasing the accurate positioning of the functional surface of the loading track, etc.

Inactive Publication Date: 2014-02-19
ELECTRO SCI IND INC
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

In order to increase the probability of accurate positioning of the load rail functional surface 70 relative to the test hole 26, very tight tolerances need to be maintained, which adds complexity and cost to the manufacturer and maintenance of the handler 10.

Method used

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  • Improved electronic component handler test plate
  • Improved electronic component handler test plate
  • Improved electronic component handler test plate

Examples

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Embodiment Construction

[0017] Referring to Figures 1, 2 and 3, there is shown generally a known electronic component handler 10 corresponding to US Patent No. 5.942,579 assigned to Electronic Science Industries, Inc., the assignee of the present invention. Handler 10 generally includes a support structure 14 , an inclined planar surface 18 , and a test plate 24 having a plurality of concentric test holes or seats 26 . The handler 10 further includes a contactor assembly 30 having a number of test modules 32 radially and angularly aligned with the test holes 26, as generally shown. The handler 10 generally includes a loading area 28 in which a loading frame 34 is positioned and used to dispense electrical components 50 to be tested towards the test plate 24 through a hopper 44 and hopper 46 .

[0018] Loading frame 34 includes a number of arcuate seating baffles 40 for receiving and separating assemblies 50 toward test holes 26, as further described below. When a plurality of electrical assemblies 5...

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PUM

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Abstract

The present invention describes an improved electronic component handler and associated improved test board. Guides on the test plate are used to intersect the test holes to eliminate misalignment of the component loading frame with the holes to ensure easy insertion of components into the test holes.

Description

technical field [0001] This invention relates generally to electronic component handling apparatus and, more particularly, to improvements to electronic component handlers and test boards. Background technique [0002] Electronic components are handled by a wide variety of different electronic component handlers. These various processors include, but are not limited to, those sold by Electro Scientific Industries, Portland, Oregon, the assignee of this patent application. Electronic Science Industries, Inc. sells a variety of electronic component handlers including, but not limited to, a high-volume MLCC tester sold as Model 3300, a chip array tester sold as Model 3400, a vision test system sold as Model 6650, and a Chip Array Terminals sold by 753. [0003] One such electronic component testing machine is described in US Patent No. 5,842,579, entitled "Electrical Circuit Component Handler." Referring to FIG. 2, incorporated herein as in FIG. 1, there is shown an overall ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R31/28
CPCG01R31/2893
Inventor 杰拉尔德·F·博
Owner ELECTRO SCI IND INC