Fault diagnosis method of large-sized photovoltaic array

A photovoltaic array and fault diagnosis technology, applied in the monitoring of photovoltaic systems, photovoltaic power generation, photovoltaic modules, etc., can solve the problems of difficult to achieve online fault diagnosis and alarm, inability to distinguish whether the temperature difference is not obvious, accuracy and efficiency depend on, etc. The effect of accurate and reliable measurement results, fast measurement and simple equipment

Inactive Publication Date: 2010-11-24
TIANJIN UNIV
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Problems solved by technology

[0003] This method has some defects, such as: poor real-time performance, can not distinguish the state of the temperature difference is not obvious, the accuracy ...

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  • Fault diagnosis method of large-sized photovoltaic array
  • Fault diagnosis method of large-sized photovoltaic array
  • Fault diagnosis method of large-sized photovoltaic array

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Embodiment Construction

[0020] In the present invention, the battery panels are connected in parallel first and then in series, and the photovoltaic array structure formed by the battery panels in this way is called a TCT structure. figure 1 It is a schematic diagram of a photovoltaic array with a TCT structure. Compared with the other three connection methods of battery panels (series connection, parallel connection, first series connection and then parallel connection), this connection method is easy to detect the location of a faulty photovoltaic cell. figure 2 It is a schematic diagram of the other three connection methods of the battery board.

[0021] The connection mode of the sensor in the present invention is as follows: the current sensor should be connected in series in the circuit under test to measure the current. Since the internal resistance of the current sensor is very small, the connection mode of the battery boards in parallel first and then in series remains unchanged. The voltag...

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Abstract

The invention belongs to the technical field of photovoltaic cell detection and provides a fault diagnosis method of a large-sized photovoltaic array, aiming at realizing the quick and accurate positioning of cell boards having faults. The fault diagnosis method of the large-sized photovoltaic array comprises the following steps of: connecting a plurality of cell boards in parallel to form a layer and then connecting in series to form a plurality of series layers; setting the number of the first layer of cell boards which are directly connected with current sensors to be L0, wherein the possibly generated maximum current value passing through the first layer is L0*Im, and the Im is the maximum current value which is generated by the cell boards under normal condition; if the work conditions are known, improving the Im as the work current under the condition and using the maximum current value of each layer of current sensor as a reference value for judging whether errors are generated or not; and detecting whether the L0 cell boards are subjected to faults or not. The invention is mainly applied to the photovoltaic cell detection.

Description

technical field [0001] The invention belongs to the technical fields of photovoltaic power generation and battery detection. Specifically, it involves a fault diagnosis method for large-scale photovoltaic power generation systems. Background technique [0002] At present, the commonly used methods for detecting hot spots, slivers, aging and other faults of photovoltaic systems are based on infrared image analysis. The surface temperature difference between the photovoltaic cell with the hot spot phenomenon and the normal working cell is relatively large, resulting in a significant difference in the infrared images produced by the two. Through the processing and analysis of the infrared image, the characteristic information of the hot spot fault area can be extracted, so as to realize the identification of whether the working state of the photovoltaic cell is normal or not. [0003] This method has some defects, such as: poor real-time performance, inability to distinguish ...

Claims

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Application Information

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IPC IPC(8): G01R31/26H01L31/00H02S50/10
CPCY02E10/50
Inventor 程泽李冰峰刘艳莉
Owner TIANJIN UNIV
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