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Inspection device using chips

A technology for inspection devices and chips, applied to measuring devices, material analysis through optical means, instruments, etc., can solve problems such as inability to distinguish and obtain measurement results, and achieve simple operation, miniaturization, reliability and non-shielding/ The effect of shaded controls

Active Publication Date: 2014-10-08
USHIO DENKI KK
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

In this way, in the photodetector, it is impossible to distinguish whether the fluorescence is from the sample or the fluorescence from the foreign matter, and there are cases where accurate measurement results cannot be obtained.

Method used

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  • Inspection device using chips

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Embodiment Construction

[0064] First, the characteristics of the present invention will be described. First, except when performing light detection on the sample, the shielding body is used to suppress the adhesion of foreign matter such as dust and dust to the photometric part. Second, the following control is performed through the drive control of a single drive mechanism: Rotor Rotation restriction control, which is based on the control of the convex part linked to the drive shaft of the drive mechanism; the opening and closing control of the shielding body, which is the control of the moving body driven by the driving mechanism; and the opening and closing of the restriction body. The movable control restricts the opening and closing of the cover, and the opening and closing of the cover is the opening and closing of the moving body driven by the driving mechanism.

[0065] Below, refer to Figure 1 to Figure 7 One embodiment of the present invention will be described.

[0066] figure 1 It is a...

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Abstract

The present invention provides an inspection device using a chip that suppresses foreign matter from adhering to optical components such as a photometry unit used to inspect a sample. The inspection device using a chip includes: a rotor (5), holding the chip (4); a measurement chamber (7), storing the rotor (5), and setting a through hole (71); a light source (84), passing through the through hole (71), irradiate the chip (4) with light for measurement; the light metering unit (8), detects the light from the chip (4); the rotary drive mechanism (6), rotates the rotor (5), and is characterized in that , between the through-hole (71) and the opening (81) of the photometric unit (8) through which light passes, a shielding body (9) capable of shielding or not shielding the opening (81) is provided, and the chip (4 ) when irradiating light and when not being detected by the photometry unit (8), the opening (81) is shielded by the shielding body (8).

Description

technical field [0001] The present invention relates to an inspection device using a chip, and more particularly to an inspection device using a chip for optically inspecting a sample accumulated by centrifugal force by rotating the chip. Background technique [0002] Figure 8 is a drawing showing a sample component detection device disclosed in Patent Document 1. As shown in the figure, this device is used to hold the molded part 201 injected with the sample on the disc 202, and the disc 202 is rotated by the centrifugal drive mechanism 203 to apply centrifugal force, and the light source 204 is applied to the results. The obtained sample is irradiated with light, and the light detection unit 205 detects the fluorescence emitted from the sample. In addition, this document describes that it is possible to provide a sample component detection device that does not affect measurement results even in an abnormal state such as dust adhering to the microarray. [0003] Patent D...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N21/15G01N21/01
CPCG01N2035/00158G01N21/15
Inventor 小川义正金田和之
Owner USHIO DENKI KK
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