Dynamic method for measuring surface property parameters of substance
A technology for measuring surface properties and parameters, applied in measuring devices, scientific instruments, measuring electrical variables, etc.
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[0096] The preferred embodiments of the present invention will be described in detail below in conjunction with the accompanying drawings; it should be understood that the preferred embodiments are only for illustrating the present invention, rather than limiting the protection scope of the present invention.
[0097] figure 1 The structure schematic diagram of the material surface property parameter analysis system based on the kinetic method provided by the embodiment of the present invention, as shown in the figure, provides the joint analysis system structure of the material surface property parameter based on the kinetic method. The material surface property parameter determination and analysis system of the method includes a sample processing system and a detection system;
[0098] The sample processing system includes a reactor 3, a liquid collector 5 to be tested, a liquid container 6 for the liquid to be tested, a millivoltmeter, a constant flow pump 4, a liquid conta...
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