Programmable trouble power simulator
A power supply simulation and fault technology, applied in the direction of measuring devices, measuring electricity, measuring electrical variables, etc., can solve the problem of not being able to comprehensively reflect the faulty power grid, unable to meet all the requirements of wind turbine performance testing, and wind turbine grid connection point voltage fluctuations, etc. question
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Publication Date
- 2012-06-27
- Estimated Expiration
- Not applicable · inactive patent
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Abstract
Description
technical field
[0001] The invention relates to a programmable fault power simulation device, which can be used as a test device for the research of wind power generation systems based on double-fed induction generators or permanent magnet synchronous motors and the performance assessment of the factory, and can also be used as a performance test device for other grid-connected power electronic equipment. Faulty power supply unit for testing. Background technique
[0002] With the rapid increase in the proportion of large-scale wind turbines mainly based on variable-speed constant-frequency doubly fed induction generators (DFIG) in the power grid, the power system has a great impact on the operation of grid-connected wind turbines under external grid failures. Capabilities put forward higher and higher demands. Judging from the wind power grid-connected regulations issued by wind power operators or power dispatching departments in various countries in the world, when there ...
Examples
Embodiment Construction
[0038] The programmable fault power supply simulation device for wind power generation of the present invention can realize various power grid faults such as symmetrical and asymmetrical voltage drop and pumping, three-phase unbalance, harmonic distortion, frequency drift, phase angle jump, voltage fluctuation, etc. Simulation, strong function expansion; and because of the voltage closed-loop control ability, it can ensure that the internal resistance voltage drop of the power supply caused by the huge inrush current will not cause the loss of the dynamic waveform and drop range of the voltage drop in the application, which solves the problem of using resistance division. The test voltage error caused by the large voltage drop of the internal resistance of the power supply and the absence of a voltage closed loop effectively improves the experimental accuracy of the device and has strong robustness.
[0039] The present invention will be further described below in conjunction w...