Method and device for measuring lateral magnification of optical system based on point target image stitching

Abstract

The invention relates to a method and a device for measuring the lateral magnification of an optical system based on joining of point target images, belonging to the field of metering equipment taking an optical method as a characteristic. The method is characterized in that a point target is in different fields of view and is imaged for twice, and a linear image is constructed according to two point target images; and in a frequency domain, by a principle that a frequency at which a modulation transfer function value obtained by actual measurement reaches a minimum value for the first time is equal to a theoretical cutoff frequency, the lateral magnification of the optical system is calculated. According to the device, a sliding block for bearing the point target is arranged on a first guide rail and a second guide rail, and the motion of the sliding block on the first guide rail is matched with the motion of the sliding block on the second guide rail, so that in any field of view, the point target can be accurately focused to be imaged onto the surface of an image sensor. According to the method and the device for measuring the lateral magnification of the optical system, the errors between single-time measurement results can be reduced, and further, the repeatability of measurement results can be improved.

Description

technical field [0001] The method and device for measuring the lateral magnification of an optical system based on point target image mosaicing belong to the field of metrology equipment characterized by the use of optical methods, and in particular relate to a static point light source as the target, and use two frames of static point target images in the frequency domain to measure A method and device for lateral magnification of an optical system. Background technique [0002] The lateral magnification of the optical system is a very important parameter in the field of medicine and precision measurement. It not only indicates the technical index of the optical system, but also can use this technical index to carry out precise measurement of other parameters. However, how to obtain the lateral magnification of an optical system is the primary problem in carrying out this work. [0003] 1. The measurement method of the lateral magnification of the optical system [0004] ...

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Problems solved by technology

[0028] The present invention aims at the large distortion optical system of the above-mentioned existing measurement method, which is not suitable for measurement in a large field of view, but in a small field of view, there is the problem of low repeatability of lateral magnification measurement, and the existing measurement device has the problem of separation In view of the problem of focusing, a method and device for measuring the lateral magnification of an optical system is proposed. This method can improve the repeatability of measurement results in a small field of view and is more suitable for measuring the lateral magnification of a large distortion optical system; the device can eliminate defocus Influence on the measurement results, further improving the repeatability of the measurement results

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