33results about How to "Amortized error" patented technology

The invention provides a lateral magnification measuring method for a point target image-spliced optical system and a lateral magnification measuring device, belonging to the field of metering equipment which takes an optical method as the characteristic. According to the method, a point target is under different view fields and is imaged twice, a linear image is formed according to two point target images, the dereferencing range of a pixel distance is searched in a frequency domain, and according to the condition that a practical modulation transfer function curve and a theoretical modulation transfer function curve, which are related with the pixel distance, the contact ratio is best in the case of least squares, the lateral magnification of the optical system is computed by a search algorithm; a slide block carried with a point target in the device is arranged on a first guide rail and a second guide rail, and the motion of the slide block on the first guide rail and the motion of the slide block on the second guide rail are matched with each other, so that the point target is exactly focused and imaged to the surface of an image sensor at any view filed position; and the lateral magnification of the optical system is measured by the invention, so that the error among single-measurement results can be preferably reduced, and the repeatability of the measurement results can be further improved.

A method and a device for measuring transverse magnification of an optical system by means of uniform-speed moving point targets belong to the field of metering equipment characterized by an optical method. The method includes: imaging point targets moving at a uniform speed to obtain a linear image; finding the value range of pixel spacing in a frequency domain; and calculating the transverse magnification of the optical system by means of genetic algorithm according to the fact that a practical modulation transfer function curve and a theoretic modulation transfer function curve related to the pixel spacing have the highest overlap ratio under the least square condition. In the device, sliders for bearing the point targets are mounted on a first guide rail and a second guide rail, a controller controls the sliders to move on the first guide rail at a uniform speed while controlling the sliders to move on the second guide rail, and movements in two directions are matched with each other, so that the point targets are constantly focused and imaged on the surface of an image sensor during movement. By the aid of the method and the device for measuring the transverse magnification of the optical system, errors of single measuring results can be decreased, and further repeatability of measuring results is improved.

A method and a device for measuring the pixel pitch of an image sensor based on the point-target image splicing technology, which belong to the length, width or thickness metering field included in the field of metering equipment which is characterized by using an optical method. The method includes placing the point targets in different fields of view, and performing twice imaging of the point targets; constructing linear images according to the two point-target images; searching value ranges of the pixel pitch in the frequency domain, and calculating to obtain the pixel pitch by means of the search algorithm according to the best contact ratio of the actual modulation transfer function(MTF) curve related to the pixel pitch and the theoretical MTF curve related to the pixel pitch under the condition of the least square. Sliders bearing the point targets are arranged on a first guide rail and a second guide rail, and the movement of the slider on the first guide rail matches with the movement of the slider on the second guide rail so that the point targets can be focused correctly to form images on the surface of the image sensor at the position of any field of view. The method and the device for measuring the pixel pitch of the image sensor are favorable for reducing errors among results of single measurements, so that repetition of measuring results can be increased.

A method and a device for measuring transverse magnification of an optical system by means of point target image splicing belong to the field of metering equipment characterized by an optical method. The method includes: positioning point targets in different view fields and imaging the point targets twice; constructing a linear image according to two point target images; finding the value range of pixel spacing in a frequency domain; and calculating the transverse magnification of the optical system by means of genetic algorithm according to the fact that a practical modulation transfer function curve and a theoretic modulation transfer function curve related to the pixel spacing have the highest overlap ratio under the least square condition. In the device, sliders for bearing the point targets are mounted on a first guide rail and a second guide rail, and the movement of the sliders on the first guide rail is matched with that of the sliders on the second guide rail, so that the point targets are imaged on the surface of an image sensor at an optional position of a view field in a focused manner. By the aid of the method and the device for measuring the transverse magnification of the optical system, errors of single measuring results can be decreased, and further repeatability of measuring results is improved.

The invention relates to a method and device for measuring the space of pixels of an image sensor by using the linear light source, belonging to the field of the measurement of length, width or thickness by adopting the optical method. The method comprises the following steps: obtaining a linear image by using the linear light source as a target, searching the value taking range of the space of the pixels in the frequency domain, and calculating the space of the pixels according to the characteristic that the actual modulation transfer function curve and the theoretical modulation transfer function curve which are relevant to the space of the pixels can coincide best under the least square condition. The device is characterized in that the linear light source is curved in a plane defined by the optical axis direction and the row or column direction of the image sensor and the point target can be imaged in any position on the linear light source by calibrating the focus. Due to the adoption of the method and the device for measuring the space of pixels of the image sensor, the errors between the single-time measurement results can be reduced, and the repeatability of the measurement results can be improved accordingly.

The invention relates to a method and a device for measuring optical system lateral magnification by utilizing uniform-speed moving point target, belonging to the field of metering equipment taking an optical method as a characteristic. In the method, a points target is imaged under the uniform-speed motion state, so that a linear image is obtained; and in a frequency domain, a value range of pitch of pixels is found, and because the actual modification transfer function curve relative to a pixel pitch and a theoretical modification transfer function curve have the best contact ratio under the least square condition, and the optical system lateral magnification is calculated by a search algorithm to be obtained. In the device, a sliding block for bearing the point target is arranged on first rails and second rails, a controller controls the sliding block to do uniform-speed motion on the first rails, and at the same time, controls the sliding block to do motion on the second rails, and the motions in the two directions are matched, so that during the motion process, the point target is always focused to be imaged onto the surface of an image senor. By adopting the method and the device to measure the optical system lateral magnification rate, the errors between single-time measurement results can be reduced, and further, the repeatability of the measurement results can be improved.

The invention discloses a method and a device for measuring lateral magnification of an optical system, belonging to the metering equipment field taking optical method as characteristic, wherein the method comprises the steps of taking line light source as target to obtain a linear image; finding value range of the pixel distance in the frequency domain; using the search algorithm to perform computing to obtain lateral magnification of the optical system according to that the overlap ratio of the actual modulation transfer function curve related to the pixel distance and the theoretical actual modulation transfer function curve is the best on the least squares condition; and the line light source is a bent shape in a plane determined by the optical axis direction of the device and row or line direction of the image sensor; any position of the line light source can image focally to the surface of the image sensor. The method for measuring lateral magnification of an optical system in the invention is beneficial for reducing error between single measurement results so as to improve repeatability of the measurement result.