33results about How to "Amortized error" patented technology

A method and a device based on a uniform-speed moving point target for measuring transverse magnification of an optical system belongs to the field of measuring equipment characterized by optical methods. The method has the following steps: imaging for a point target is performed to obtain a linear image when the point target is in uniform motion; and the transverse magnification of the optical system of an image sensor can be calculated based on the fact that the theoretical cutoff frequency equals to the frequency corresponding to the first minimum of the modulation transfer function value obtained within the frequency domain through the practical measurement. A sliding block for bearing the point target in the device is installed on a first guiding rail and a second guiding rail; a controller is used for controlling the sliding block to move on the second guiding rail when the controller is used for controlling the sliding block to perform uniform motion on the first guiding rail, the movement in the two directions are matched, so that the point target can be always focused and imaged on the surface of the image sensor during the movement; and through adopting the method and the device for measuring the transverse magnification of the optical system, the error reduction of single measurement can be facilitated, so that the repeatability of measurement results can be improved.

A method and a device based on a uniform-speed moving point target for measuring transverse magnification of an optical system belongs to the field of measuring equipment characterized by optical methods. The method has the following steps: imaging for a point target is performed to obtain a linear image when the point target is in uniform motion; and the transverse magnification of the optical system of an image sensor can be calculated based on the fact that the theoretical cutoff frequency equals to the frequency corresponding to the first minimum of the modulation transfer function value obtained within the frequency domain through the practical measurement. A sliding block for bearing the point target in the device is installed on a first guiding rail and a second guiding rail; a controller is used for controlling the sliding block to move on the second guiding rail when the controller is used for controlling the sliding block to perform uniform motion on the first guiding rail, the movement in the two directions are matched, so that the point target can be always focused and imaged on the surface of the image sensor during the movement; and through adopting the method and the device for measuring the transverse magnification of the optical system, the error reduction of single measurement can be facilitated, so that the repeatability of measurement results can be improved.

A method and a device for measuring pixel pitch of an image sensor by utilizing a constant moving point target belong to the field of length, width or thickness measurement characterized by applying an optical method. The method for measuring the pixel pitch of the image sensor by utilizing the constant moving point target includes: acquiring a linear image by implementing an image formation when the point target constantly moves, searching for a value range of the pixel pitch in a frequency domain, and calculating to obtain the pixel pitch by utilizing a genetic algorithm according to the fact that an contact ratio between a practical modulation transfer function curve which is related to the pixel pitch and a theoretical modulation transfer function curve is the best under least squares conditions. Sliding blocks bearing the point target in the device for measuring the pixel pitch of the image sensor by utilizing constant moving point target is arranged on a first guide rail and a second guide rail, a controller controls the sliding block to uniformly move on the first guide rail while controlling the sliding block to move on the second guide rail, and the movements of the sliding blocks are matched with each other so that the point target is subjected to quasi focal imaging to the surface of the image sensor during motion . By adopting the method for measuring the pixel pitch of the image sensor by utilizing the constant moving point target, error among single measurement results can be reduced so that repeatability of the measurement results can be improved.

A method and a device for measuring pixel pitch of an image sensor on the basis of a line light source belong to the field of length, or width or thickness metering of the metering equipment field which is characterized by utilizing an optical method. The method for measuring the pixel pitch of the image sensor on the basis of the line light source includes that a linear image is obtained by targeting the line light source, the pixel pitch of the image sensor is acquired by calculating by using the equality of a practically- measured frequency when the modulation transfer function value reaches the minimum value for the first time with a theoretical cutoff frequency in a frequency domain. The device for measuring the pixel pitch of the image sensor on the basis of the line light source is located in the plane determined by an optical axis direction and a row direction or a line direction of the image sensor, the line light source is curved, any part of the line light source can be subjected to quasi focal imaging to the surface of the image sensor. By adopting the method and the device for measuring the pixel pitch of the image sensor on the basis of line light source, errors among results of a single measurement can be reduced so that repeatability of the measurement results can be improved.

A method and a device for measuring pixel pitch of an image sensor by utilizing a line light source belong to a field of calculating a length, a width or a thickness in a measuring equipment field which is characterized by applying optical method. The method for measuring the pixel pitch of the image sensor by utilizing line light source is characterized in that a linear image is acquired by targeting the line light source, a value range of the pixel pitch is searched in a frequency domain, the pixel pitch of the image sensor is acquired by calculating on the basis of utilizing a search algorithm in case that the contact ratio between a practical modulation transfer function curve which is related to the pixel pitch and a theoretical modulation transfer function curve is the best under least squares conditions. The device for measuring the pixel pitch of the image sensor by utilizing line light source is located in the plane determined by an optical axis direction and a row direction or a column direction of the image sensor, the line light source is of forniciform, any part of the line light source can be subjected to quasi focal imaging to the surface of the image sensor. By adopting the method for measuring the pixel pitch of the image sensor by utilizing line light source, error between single measurement results can be reduced to improve repeatability of the measurement results.

The invention discloses a method and a device for measuring the transverse magnifying power of an optical system based on a linear source, which belong to the field of metering equipment which is characterized by the adoption of an optical method. In the method, a linear image is obtained by taking the linear source as a target, and the transverse magnifying power of the optical system is calculated since a frequency which corresponds to a moment when a practically-measured modulation transfer function value reaches a minimum value for the first time in a frequency domain is equal to a theoretical cutoff frequency. In the device, the linear source is bent in a plane which is defined by the optical axis direction of the device and the line or raw direction of the image sensor, and any position on the linear source is focused and imaged on the surface of an image sensor. Due to the adoption of the method and the device for measuring the transverse magnifying power of the optical system, reduction in errors among single measuring results is facilitated, and the repetitiveness of the measuring results is enhanced.