Method and device for measuring lateral magnification of optical system
A technology of lateral magnification and optical system, applied in the field of metrology equipment, can solve the problem of low repeatability of lateral magnification measurement, achieve the effect of improving the repeatability of measurement results, reducing errors, and improving repeatability
Active Publication Date: 2012-07-25
HARBIN INST OF TECH
8 Cites 2 Cited by
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Abstract
The invention discloses a method and a device for measuring lateral magnification of an optical system, belonging to the metering equipment field taking optical method as characteristic, wherein the method comprises the steps of taking line light source as target to obtain a linear image; finding value range of the pixel distance in the frequency domain; using the search algorithm to perform computing to obtain lateral magnification of the optical system according to that the overlap ratio of the actual modulation transfer function curve related to the pixel distance and the theoretical actual modulation transfer function curve is the best on the least squares condition; and the line light source is a bent shape in a plane determined by the optical axis direction of the device and row or line direction of the image sensor; any position of the line light source can image focally to the surface of the image sensor. The method for measuring lateral magnification of an optical system in the invention is beneficial for reducing error between single measurement results so as to improve repeatability of the measurement result.
Application Domain
Testing optical properties
Technology Topic
Least squaresImage sensor +12
Image
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- Experimental program(1)
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Classification and recommendation of technical efficacy words
- Amortized error
- reduce mistakes