Measurement method of lateral magnification of optical system based on line light source

Abstract

The invention discloses a method and a device for measuring the transverse magnifying power of an optical system based on a linear source, which belong to the field of metering equipment which is characterized by the adoption of an optical method. In the method, a linear image is obtained by taking the linear source as a target, and the transverse magnifying power of the optical system is calculated since a frequency which corresponds to a moment when a practically-measured modulation transfer function value reaches a minimum value for the first time in a frequency domain is equal to a theoretical cutoff frequency. In the device, the linear source is bent in a plane which is defined by the optical axis direction of the device and the line or raw direction of the image sensor, and any position on the linear source is focused and imaged on the surface of an image sensor. Due to the adoption of the method and the device for measuring the transverse magnifying power of the optical system, reduction in errors among single measuring results is facilitated, and the repetitiveness of the measuring results is enhanced.

Description

technical field [0001] The method and device for measuring the lateral magnification of an optical system based on a line light source belong to the field of metrology equipment characterized by the use of optical methods, and in particular relate to a method for measuring the lateral magnification of an optical system by using a line light source image in the frequency domain with a line light source as the target. Methods and devices. Background technique [0002] The lateral magnification of the optical system is a very important parameter in the field of medicine and precision measurement. It not only indicates the technical index of the optical system, but also can use this technical index to carry out precise measurement of other parameters. However, how to obtain the lateral magnification of an optical system is the primary problem in carrying out this work. [0003] 1. The measurement method of the lateral magnification of the optical system [0004] In July 1987, ...

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Problems solved by technology

[0028] The present invention aims at the large distortion optical system of the above-mentioned existing measurement method, which is not suitable for measurement in a large field of view, but in a small field of view, there is the problem of low repeatability of lateral magnification measurement, and the existing measurement device has the problem of separation In view of the problem of focusing, a method and device for measuring the lateral magnification of an optical system is proposed. This method can improve the repeatability of measurement results in a small field of view and is more suitable for measuring the lateral magnification of a large distortion optical system; the device can eliminate defocus Influence on the measurement results, further improving the repeatability of the measurement results

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