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Method and device for measuring lateral magnification of optical system using point target image stitching

A technology of lateral magnification and optical system, which is applied in the field of optical system lateral magnification measurement and device using point target image stitching, can solve the problem of low repeatability of lateral magnification measurement, achieve small error, reduce error, cut off The effect of accurate frequency position

Active Publication Date: 2014-10-15
哈尔滨工业大学高新技术开发总公司
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Problems solved by technology

[0028] The present invention aims at the large distortion optical system of the above-mentioned existing measurement method, which is not suitable for measurement in a large field of view, but in a small field of view, there is the problem of low repeatability of lateral magnification measurement, and the existing measurement device has the problem of separation In view of the problem of focusing, a method and device for measuring the lateral magnification of an optical system is proposed. This method can improve the repeatability of measurement results in a small field of view and is more suitable for measuring the lateral magnification of a large distortion optical system; the device can eliminate defocus Influence on the measurement results, further improving the repeatability of the measurement results

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  • Method and device for measuring lateral magnification of optical system using point target image stitching
  • Method and device for measuring lateral magnification of optical system using point target image stitching

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Embodiment Construction

[0054] The specific embodiments of the present invention will be further described in detail below with reference to the accompanying drawings.

[0055] figure 1 It is a schematic structural diagram of a device for measuring lateral magnification of an optical system using point target image stitching; the device includes a point target 1, an optical system 2, an image sensor 3, a slider 4 and a first guide rail 5 in the direction perpendicular to the optical axis. The target 1 is imaged onto the surface of the image sensor 3 through the optical system 2; and the device also includes a second guide rail 6 along the optical axis direction, and the slider 4 carrying the point target 1 is mounted on the first guide rail 5 and the second guide rail 6, The movement of the slider 4 on the first guide rail 5 is matched with the movement of the slider 4 on the second guide rail 6, so that the point target 1 can be imaged on the surface of the image sensor 3 in focus at any position of...

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Abstract

A method and a device for measuring transverse magnification of an optical system by means of point target image splicing belong to the field of metering equipment characterized by an optical method. The method includes: positioning point targets in different view fields and imaging the point targets twice; constructing a linear image according to two point target images; finding the value range of pixel spacing in a frequency domain; and calculating the transverse magnification of the optical system by means of genetic algorithm according to the fact that a practical modulation transfer function curve and a theoretic modulation transfer function curve related to the pixel spacing have the highest overlap ratio under the least square condition. In the device, sliders for bearing the point targets are mounted on a first guide rail and a second guide rail, and the movement of the sliders on the first guide rail is matched with that of the sliders on the second guide rail, so that the point targets are imaged on the surface of an image sensor at an optional position of a view field in a focused manner. By the aid of the method and the device for measuring the transverse magnification of the optical system, errors of single measuring results can be decreased, and further repeatability of measuring results is improved.

Description

technical field [0001] The method and device for measuring the lateral magnification of an optical system using point target image stitching belong to the field of measurement equipment characterized by adopting an optical method, and in particular relates to a static point light source as the target, and two frames of static point target images are used in the frequency domain to measure Method and apparatus for lateral magnification of an optical system. Background technique [0002] The lateral magnification of the optical system is a very important parameter in the field of medicine and precision measurement. It not only indicates the technical index of the optical system, but also can use this technical index to carry out precise measurement of other parameters. However, how to obtain the lateral magnification of an optical system is the primary problem in carrying out this work. [0003] 1. The problem of measurement method of lateral magnification of optical system ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01M11/02
Inventor 谭久彬赵烟桥刘俭
Owner 哈尔滨工业大学高新技术开发总公司
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