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Method adopting line source for measuring transverse magnification of optical system

A technology of lateral magnification and optical system, which is applied in the field of lateral magnification measurement of optical systems using line light sources, can solve the problem of low repeatability of lateral magnification measurement, improve the repeatability of measurement results, reduce errors, and improve repeatability sexual effect

Active Publication Date: 2014-12-03
HARBIN INST OF TECH
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Problems solved by technology

[0028] The present invention aims at the large distortion optical system of the above-mentioned existing measurement method, which is not suitable for measurement in a large field of view, but in a small field of view, there is the problem of low repeatability of lateral magnification measurement, and the existing measurement device has the problem of separation In view of the problem of focusing, a method and device for measuring the lateral magnification of an optical system is proposed. This method can improve the repeatability of measurement results in a small field of view and is more suitable for measuring the lateral magnification of a large distortion optical system; the device can eliminate defocus Influence on the measurement results, further improving the repeatability of the measurement results

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  • Method adopting line source for measuring transverse magnification of optical system
  • Method adopting line source for measuring transverse magnification of optical system
  • Method adopting line source for measuring transverse magnification of optical system

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Embodiment Construction

[0050] Specific embodiments of the present invention will be further described in detail below in conjunction with the accompanying drawings.

[0051] figure 1 It is a schematic structural diagram of an optical system lateral magnification measurement device using a line light source, and its planar light path diagram is as follows figure 2 As shown; the device includes a line light source 1, an optical system 2, and an image sensor 3, and the line light source 1 is imaged to the surface of the image sensor 3 through the optical system 2, and, in the direction of the optical axis of the device and the row direction of the image sensor 3 In a determined plane, the line light source 1 is curved, and any position on the line light source 1 is quasi-focused and imaged on the surface of the image sensor 3; wherein, the lateral length of the line light source 1 is 3 mm, and the pixel pitch of the image sensor 3 is 5.6 μm.

[0052] The method for measuring the lateral magnificatio...

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Abstract

A method and a device adopting a line source for measuring transverse magnification of an optical system belong to the field of measuring equipment characterized by optical methods. The method has the steps that a line source serves as a target to obtain a linear image; a value range of pixel pitch is obtained within the frequency domain; and the transverse magnification of the optical system can be calculated through the genetic algorithm and based on the fact that an actual modulation transfer function curve and a theoretic modulation transfer function curve related to the pixel pitch have the best contact ratio at the least squares. Within the plane defined by the optical axis direction of the device and the row direction or the line direction of an image sensor, the line source is curve, and the focusing and imaging on the surface of the image sensor at any position of the line source can be realized. Through adopting the method and the device for measuring the transverse magnification of the optical system, the error reduction of single measurement can be facilitated, so that the repeatability of measurement results can be improved.

Description

technical field [0001] The method for measuring the lateral magnification of an optical system using a line light source belongs to the field of metering equipment characterized by the use of optical methods, and in particular relates to a method for measuring the lateral magnification of an optical system by using a line light source image in the frequency domain with a line light source as the target. Background technique [0002] The lateral magnification of the optical system is a very important parameter in the field of medicine and precision measurement. It not only indicates the technical index of the optical system, but also can use this technical index to carry out precise measurement of other parameters. However, how to obtain the lateral magnification of an optical system is the primary problem in carrying out this work. [0003] 1. The measurement method of the lateral magnification of the optical system [0004] In July 1987, "Medical Physics" published an arti...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01M11/02
Inventor 谭久彬赵烟桥刘俭
Owner HARBIN INST OF TECH
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