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Test slot carriers

A technology of test slots and brackets, which is applied in the direction of digital signal error detection/correction, digital recording/reproduction, data recording, etc., and can solve problems such as low output, loose magnetic heads, and excessive vibration.

Inactive Publication Date: 2012-10-17
TERADYNE
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

This vibration "crosstalk" along with external vibration sources can cause crash failures, head looseness and non-repeatable off-track (NRRO), which can result in lower yields and increased manufacturing costs
Current disk drive testing systems employ automated and structured support systems that cause excessive vibration in the system and / or require a large footprint

Method used

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Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0049] System Overview

[0050] Such as figure 1 As shown, the storage device testing system 10 includes a plurality of test racks 100 (for example, 10 test racks are shown in the figure), a transfer station 200 , and an automatic control device 300 . Such as Figure 2A with 2B As shown, each test rack 100 generally includes a base 102 . The base 102 may be constructed from a plurality of structural members 104 (such as formed sheet metal, extruded aluminum, steel tubing, and / or composite members) that are fastened together and collectively define a plurality of trays. rack container 106 .

[0051] Each rack receptacle 106 may support a test slot rack 110 . Such as Figure 3A with 3B As shown, each test slot carrier 110 supports a plurality of test slot assemblies 120 . Different ones of the test slot trays 110 may be configured to perform different types of tests and / or test different types of memory devices. The test slot racks 110 are also interchangeable with ea...

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Abstract

A test rack for a storage device testing system includes a plurality of test slot carriers. Each of the test slot carriers includes a plurality of test slot assemblies. The test slot assemblies are configured to received and support storage devices for testing. The test rack also includes a chassis. The chassis includes a plurality of carrier receptacles for releasable receiving and supporting the test slot carriers. The test slot carriers are interchangeable with each other among the various carrier receptacles.

Description

technical field [0001] The present invention relates to test slot carriers and related devices, systems, and methods. Background technique [0002] Storage device manufacturers typically test that the storage devices they manufacture meet a set of requirements. Test equipment and techniques exist for testing large numbers of storage devices serially or in parallel. Manufacturers often test large numbers of storage devices simultaneously or in batches. Storage device testing systems typically include one or more tester racks having a plurality of test slots that receive storage devices to be tested. In some cases, the storage device is provided in a rack that is used to load and unload the storage device to and from the test rack. [0003] Condition the test environment in close proximity to the storage device. Minimal temperature fluctuations in the test environment can be critical for precise test conditions and safety of storage settings. Also, the latest generation o...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G11B20/18G11B33/02
CPCG11B33/128G11B25/043G11B20/00007
Inventor 布莱恩·S·梅洛瓦尔奎里奥·N·卡瓦略约翰·P·托斯卡诺
Owner TERADYNE