Handheld digital integrated circuit parameter tester

An integrated circuit and tester technology, which is applied in the field of handheld digital integrated circuit parameter testers, can solve the problems of complex man-machine interface operation, single test parameters and high test cost, and achieves simple man-machine interface operation, simple operation and low cost. Effect

Inactive Publication Date: 2016-12-07
LIUZHOU RAILWAY VOCATIONAL TECHN COLLEGE
View PDF6 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] The technical problem to be solved by the present invention is to provide a hand-held digital integrated circuit parameter tester to solve the problem of single test parameters, imperfect functions, complex man-machine interface operation and easy failure, and high test cost when testing digital integrated circuit chips. Shortcomings

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Handheld digital integrated circuit parameter tester
  • Handheld digital integrated circuit parameter tester
  • Handheld digital integrated circuit parameter tester

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0035] figure 1 Disclosed in is a hand-held digital integrated circuit parameter tester, including a power management module, a central control module, a chip test interface, a communication module, and a man-machine interface module.

[0036] The output terminal of the power management module is connected to the power input terminal of the central control module to provide power for the central control module;

[0037] The central control module includes a single-chip microcomputer I and a single-chip microcomputer II. The single-chip microcomputer I is connected to the chip test interface and is specially responsible for chip detection; the single-chip microcomputer II is directly connected to the human-machine interface module and the communication module through I / O pins. Connection, responsible for controlling the liquid crystal display, touch input and serial communication; the single-chip microcomputer I and the single-chip microcomputer II are directly connected throug...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

A hand-held digital integrated circuit parameter tester, relating to an integrated circuit parameter tester, comprising a power management module, a central control module, a chip test interface, a communication module, and a man-machine interface module, the output terminal of the power management module is connected to the central control module The central control module includes single-chip microcomputer Ⅰ and single-chip microcomputer Ⅱ. The single-chip microcomputer Ⅰ is connected to the chip test interface. The single-chip microcomputer Ⅱ is directly connected to the communication module and the man-machine interface module through I / O pins. The communication module is directly connected through the SPI bus; the communication module includes a serial communication interface chip and its peripheral circuit, and the output terminal of the communication module is connected with the input terminal of the upper computer. The invention has the advantages of perfect function, stable work, simple operation, small size, low cost, etc., can be used as a teaching instrument or a testing instrument, and is suitable for popularization in school laboratories or amateur electronic enthusiasts.

Description

technical field [0001] The invention relates to an integrated circuit parameter tester, in particular to a handheld digital integrated circuit parameter tester. Background technique [0002] In the development and design of electronic systems or related practical teaching, many digital integrated circuit chips will be used. Chips will be reused in many occasions, and it is inevitable that chips will fail at this time. Using a damaged digital integrated circuit chip will greatly increase the difficulty of debugging the circuit system, and before using the chip, it is impossible to check whether the function of the chip is intact through common instruments. The professional-grade integrated circuit testing instruments used in engineering have perfect functions, but at the same time, they have disadvantages such as high price, complicated operation, and bulky size. [0003] The invention patent with the announcement number CN202583410 provides a portable Chinese interface dig...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Patents(China)
IPC IPC(8): G01R31/28
Inventor 于维佳莫振栋
Owner LIUZHOU RAILWAY VOCATIONAL TECHN COLLEGE
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap