The invention discloses a high and low temperature automatic test method and
system for a transmit-receive
vector control module, and a medium, and belongs to the technical field of
chip test. The method comprises the steps that an upper computer selects a
test channel and test items and configures test parameters; the upper computer is connected with the instrument according to the test items and performs different presetting according to the
test types; starting an automatic test, sending a matrix switch control instruction by the upper computer, performing
switch matrix channel switching and COM port switching, and then executing SIP power-up and pole writing; executing a corresponding test process according to the test type; and after the test is completed, the SIP is powered off, poles are written,
test data are stored, then whether all channels of the SIP are tested or not is judged, if not, the next channel is tested, and if all the channels are tested, all the
test data are exported. Through the full-
automatic testing process, manual intervention is reduced, and the testing efficiency of a
production line can be greatly improved. In a high and low temperature test environment, the equipment can carry out continuous multi-channel test.