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A method for measuring ion thruster beam current based on Faraday probe array

A technology of ion thrusters and probe arrays, which is applied in the direction of radiation measurement, instruments, measuring devices, etc., to achieve the effects of ensuring calculation accuracy, large amount of data information, and simplifying calculations

Active Publication Date: 2017-11-03
LANZHOU INST OF PHYSICS CHINESE ACADEMY OF SPACE TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0006] At present, there is no domestic test program for ion thruster beam divergence angle and thrust vector deflection angle at the same time

Method used

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  • A method for measuring ion thruster beam current based on Faraday probe array
  • A method for measuring ion thruster beam current based on Faraday probe array
  • A method for measuring ion thruster beam current based on Faraday probe array

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Embodiment Construction

[0048] The present invention will be described in detail below with reference to the accompanying drawings and examples.

[0049] Step 1. Build a test device.

[0050] Such as figure 1 As shown, the Faraday probe array 1 and the ion thruster 4 are placed in the vacuum chamber, and the supporting bias power supply 5, test circuit board 6, and test computer 7 are placed outside the vacuum chamber, and they together form a test system. 01, 02, 03, 04, and 05 are test cables.

[0051]The Faraday probe array 1 is formed by arranging a plurality of Faraday probes. The arrangement method is: the Faraday probes are arranged radially and form a series of concentric circles; the Faraday probes on the same radial line form a group; there are M groups and N circles of Faraday probes.

[0052] Such as figure 2 As shown, the Faraday probe array 1 is made up of a Faraday probe 9 and a disc-shaped metal support 8 made of conductive metal. The disc-shaped metal support 8 consists of a cen...

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Abstract

The invention discloses an ion thruster beam current testing method based on a Faraday probe array, which can simultaneously realize the testing of the ion thruster beam current distribution, beam divergence angle, and thrust vector deflection angle. All probe test signals are collected synchronously, and the amount of data information is large. It usually only takes a few minutes to complete a complete test and data processing. There is a shielding jacket on the outside of the ion current collection plate of each Faraday probe, and the shielding jacket is directly connected to the disc-shaped metal bracket through metal contact to realize electrical connection, then only one wire can be used to supply bias to the disc-shaped metal bracket voltage, greatly reducing the number of probe leads. When calculating the beam divergence angle, the ion beam current density current value whose test current value is less than 5% of the average value is zero, so as to reduce the measurement error. The measuring point is located in the center of the small test area, and the beam current density measured at the measuring point is regarded as the average value of the beam current in the small area, thus simplifying the calculation.

Description

technical field [0001] The invention relates to the technical field of ion thruster beam testing, in particular to an ion thruster beam testing method based on a Faraday probe array, which can be used for testing ion thruster beam distribution, beam divergence angle, and thrust vector deflection angle. Background technique [0002] The ion thruster is the core unit of the ion propulsion system to generate thrust. In the development and testing of the ion thruster, it is necessary to test and analyze its beam distribution. By processing the beam distribution test data, the beam divergence angle, thruster Performance parameters such as vector deflection angle. [0003] The beam divergence angle is a parameter reflecting the ion optical system of the ion thruster. It is an important parameter of the thruster required in the spacecraft design, and is used for the layout design of the thruster on the spacecraft. [0004] The deflection angle of the thrust vector is mainly caused...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01T1/29
Inventor 李得天张天平张伟文唐福俊顾左崔铁民江豪成孟伟丁国宗
Owner LANZHOU INST OF PHYSICS CHINESE ACADEMY OF SPACE TECH
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