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Ion thruster beam test method based on Faraday probe array

A technology of ion thrusters and probe arrays, which is applied in the direction of radiation measurement, instruments, and measuring devices, to achieve the effects of improving reliability, large amount of data information, and simplifying the structure

Active Publication Date: 2015-12-02
LANZHOU INST OF PHYSICS CHINESE ACADEMY OF SPACE TECH
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0006] At present, there is no domestic test program for ion thruster beam divergence angle and thrust vector deflection angle at the same time

Method used

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  • Ion thruster beam test method based on Faraday probe array
  • Ion thruster beam test method based on Faraday probe array
  • Ion thruster beam test method based on Faraday probe array

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Embodiment Construction

[0048] The present invention will be described in detail below with reference to the accompanying drawings and examples.

[0049] Step 1. Build a test device.

[0050] Such as figure 1 As shown, the Faraday probe array 1 and the ion thruster 4 are placed in the vacuum chamber, and the supporting bias power supply 5, test circuit board 6, and test computer 7 are placed outside the vacuum chamber, and they together form a test system. 01, 02, 03, 04, and 05 are test cables.

[0051]The Faraday probe array 1 is formed by arranging a plurality of Faraday probes. The arrangement method is: the Faraday probes are arranged radially and form a series of concentric circles; the Faraday probes on the same radial line form a group; there are M groups and N circles of Faraday probes.

[0052] like figure 2 As shown, the Faraday probe array 1 is made up of a Faraday probe 9 and a disc-shaped metal support 8 made of conductive metal. The disc-shaped metal support 8 consists of a centra...

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Abstract

The present invention discloses an ion thruster beam test method based on a Faraday probe array which can test the ion thruster beam distribution, a beam divergence angle and a thrust vector deflection angle simultaneously. All probe test signals are acquired synchronously, the data information amount is large, and the whole test and the data processing can be finished usually in only several minutes. A shielding outer sleeve is arranged at the outer side of an ion current catch tray of each Faraday probe and is directly and electrically connected with a disc-type metal support by metal contact, so that a bias voltage can be supplied to the disc-type metal support by just one conducting wire, and the number of the probe leads is reduced substantially. When the beam divergence angle is calculated, the ion beam current density flow value of which a test current value is less than 5% of an average value is set as zero, thereby reducing a measurement error. A test point is located in the center of a small test area, the beam density measured by the test point is defined as a beam average value of the small area, thereby simplifying the calculation.

Description

technical field [0001] The invention relates to the technical field of ion thruster beam testing, in particular to an ion thruster beam testing method based on a Faraday probe array, which can be used for testing ion thruster beam distribution, beam divergence angle, and thrust vector deflection angle. Background technique [0002] The ion thruster is the core unit of the ion propulsion system to generate thrust. In the development and testing of the ion thruster, it is necessary to test and analyze its beam distribution. By processing the beam distribution test data, the beam divergence angle, thruster Performance parameters such as vector deflection angle. [0003] The beam divergence angle is a parameter reflecting the ion optical system of the ion thruster. It is an important parameter of the thruster required in the spacecraft design, and is used for the layout design of the thruster on the spacecraft. [0004] The deflection angle of the thrust vector is mainly caused...

Claims

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Application Information

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IPC IPC(8): G01T1/29
Inventor 唐福俊张天平顾左崔铁民江豪成孟伟丁国宗
Owner LANZHOU INST OF PHYSICS CHINESE ACADEMY OF SPACE TECH
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