A caf test board with switch circuit
A technology of switching circuits and test boards, applied in the field of CAF test boards, can solve the problems of low efficiency of evaluation tests, increase the difficulty of failure analysis, reduce analysis efficiency, etc., to ensure test sampling rate, improve efficiency and accuracy, and reduce occupancy number effect
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0016] Below, in conjunction with accompanying drawing and specific embodiment, the present invention is described further:
[0017] Such as figure 1 A shown CAF test board with a switch circuit, including a test substrate 100, the test substrate 100 is provided with a positive test terminal 6, a negative test terminal 7, at least two test hole groups 1, a switch circuit 3 and a test hole group 1 There are equal number of positioning pad groups 5, the switch circuit 3 is located between adjacent test hole groups 1, the positive electrodes of each test hole group 1 are connected in parallel to the positive electrode test terminal 6 through the switch circuit 3, and the negative electrodes of each test hole group 1 After being connected in parallel, it is connected to the negative test terminal 7; each group of test hole groups 1 includes a plurality of test pairs of holes 11 arranged at intervals, and each group of positioning pad groups 5 includes a plurality of failure analys...
PUM
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com