CAF testing plate with switching circuit

Abstract

The invention discloses a CAF testing plate with a switching circuit, which comprises a testing substrate. The testing substrate is provided with a positive testing end, a negative testing end, at least two testing hole groups, a switching circuit and positioning pad groups with the same number as that of the testing hole groups, wherein the switching circuit is located between adjacent testing hole groups; the positive electrodes of each testing hole group are parallelly connected via the switching circuit and then connected onto the positive testing end; the negative electrodes of each testing hole group are parallelly connected and then connected onto the negative testing end; each testing hole group comprises multiple testing pair holes arranged at intervals; each positioning pad group comprises multiple failure analysis positioning pads arranged at intervals along a straight line; and each failure analysis positioning pad is located at one side of the testing hole group and is in one-to-one correspondence connection with the testing pair hole. The CAF performance testing efficiency and the failure analysis efficiency can be improved.

Description

technical field [0001] The invention relates to a test board, in particular to a CAF test board with a switch circuit. Background technique [0002] In the current industry standard IPC-9691, it is stipulated that 25 CAF test boards should be used to simultaneously test 4200 possible failure points to meet the sampling requirements of the test. In the CAF test (performance test of resistance to conductive anode wire) of the general evaluation plate, it is often necessary to carry out multiple hole wall spacing conditions at the same time, so the number of test samples at one time increases sharply. According to the traditional test board design, a single test board (module) connected to the equipment for testing needs to occupy one channel of the corresponding test equipment, while the common insulation resistance test equipment in the industry usually only has about 150 channels. When multiple boards need to be evaluated at the same time, the traditional design of the test...

AI Technical Summary

Problems solved by technology

When multiple boards need to be evaluated at the same time, the traditional design of the test board requires multiple rounds of tests to complete, and a single test requires at least 500 hours, so the efficiency of the evaluation test is extremely low

[0003] On the other hand, when the traditionally designed test is used for failure analysis, the positioning cannot be accurately located between two specific holes. Therefore, multiple grinding confirmations are required for subsequent slice analysis, which greatly increases the difficulty of failure analysis and reduces the efficiency of analysis.

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