Improved sift face feature extraction method based on key points
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- BEIJING UNIV OF CHEM TECH
- Publication Date
- 2019-01-29
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Abstract
Description
technical field
[0001] The invention relates to an improved SIFT (Scale Invariant Feature Transform) face feature extraction method based on key points, which belongs to the field of face recognition. Background technique
[0002] Face recognition is a biometric technology for identification based on human facial feature information. Compared with other biometrics, facial features have the advantages of naturalness, convenience, and non-contact, which make them have great application prospects in security monitoring, identity verification, and human-computer interaction. Therefore, face recognition technology is of great research value. Generally speaking, the face recognition process is divided into two processes: face feature extraction and face similarity score calculation. The face feature extraction process is to extract some key features of the face picture to form a face feature vector. The face similarity score calculation process is to calculate the similarity bet...