A method for preparing silicon-containing quantum dot carbon-silicon-based film material

A technology of silicon quantum dots and thin-film materials, which is applied in the field of preparation of silicon-containing quantum dots and carbon-silicon-based thin-film materials, can solve the problems of electronic inability to transition, different chemical and physical properties, and incompatibility of silicon integration processes, etc.

Active Publication Date: 2017-12-08
CHINA THREE GORGES UNIV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, silicon is an indirect band gap semiconductor, and electrons cannot directly transition from the bottom of the conduction band to the top of the valence band to emit photons.
In order to satisfy the principle of momentum conservation, it can only jump to the top of the valence band indirectly by emitting or absorbing a phonon. The probability of this indirect transition is very small, so the luminous efficiency of silicon is very low.
At present, light-emitting devices mainly use III-V compound semiconductor materials such as gallium arsenide and indium phosphide, and their luminous efficiency is much higher than that of bulk silicon materials. Very different from silicon and not compatible with silicon integration processes

Method used

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Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0014] A method for preparing a silicon-containing quantum dot carbon-silicon-based film material, the method comprising the following steps:

[0015] (1) Clean the monocrystalline silicon substrate with standard RCA cleaning technology;

[0016] (2) A non-stoichiometric silicon carbide film containing silicon quantum dots is deposited on the surface of a single crystal silicon substrate by plasma-enhanced chemical vapor deposition technology. The preparation process parameters are: RF power 50W, RF frequency 13.56MHz, substrate temperature 180 ℃, chamber pressure 60Pa, use hydrogen to dilute SiH with a volume concentration of 10% 4 Gas 30sccm, CH with a purity of 99.999% 4 Gas 20sccm, coating time 3 minutes;

[0017] (3) Deposit an amorphous carbon film on a non-stoichiometric silicon carbide film by using plasma-enhanced chemical vapor deposition technology. The preparation process parameters are: RF power 60W, RF frequency 13.56MHz, substrate temperature 180°C, chamber p...

Embodiment 2

[0021] A method for preparing a silicon-containing quantum dot carbon-silicon-based film material, the method comprising the following steps:

[0022] (1) Clean the monocrystalline silicon substrate with standard RCA cleaning technology;

[0023] (2) A non-stoichiometric silicon carbide film containing silicon quantum dots is deposited on the surface of a single crystal silicon substrate by plasma-enhanced chemical vapor deposition technology. The preparation process parameters are: RF power 100W, RF frequency 13.56MHz, substrate temperature 250 ℃, chamber pressure 90Pa, use hydrogen to dilute SiH with a volume concentration of 10% 4 Gas 40sccm, CH with a purity of 99.999% 4 Gas 25sccm, coating time 5 minutes;

[0024] (3) Amorphous carbon film was deposited on non-stoichiometric silicon carbide film by plasma-enhanced chemical vapor deposition technology. The preparation process parameters were: RF power 80W, RF frequency 13.56MHz, substrate temperature 250°C, cavity press...

Embodiment 3

[0028] A method for preparing a silicon-containing quantum dot carbon-silicon-based film material, the method comprising the following steps:

[0029] (1) Clean the monocrystalline silicon substrate with standard RCA cleaning technology;

[0030] (2) A non-stoichiometric silicon carbide film containing silicon quantum dots is deposited on the surface of a single crystal silicon substrate by plasma-enhanced chemical vapor deposition technology. The preparation process parameters are: RF power 75W, RF frequency 13.56MHz, substrate temperature 220 ℃, chamber pressure 70Pa, use hydrogen to dilute SiH with a volume concentration of 5% 4 Gas 25 sccm, CH with a purity of 99.999% 4 Gas 20sccm, coating time 7 minutes;

[0031] (3) Deposit an amorphous carbon film on a non-stoichiometric silicon carbide film by using plasma-enhanced chemical vapor deposition technology. The preparation process parameters are: RF power 70W, RF frequency 13.56MHz, substrate temperature 220°C, cavity pr...

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PUM

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Abstract

The invention discloses a method for preparing a silicon-containing quantum dot carbon-silicon-based thin film material. The steps are: using standard RCA cleaning technology to clean a single-crystal silicon substrate; using plasma-enhanced chemical vapor deposition technology to deposit a Stoichiometric silicon carbide film, silicon quantum dots are formed during the deposition process of non-stoichiometric silicon carbide film; plasma-enhanced chemical vapor deposition technology is used to deposit amorphous carbon film on non-stoichiometric silicon carbide film; repeat the above sequence, Fabrication of periodic multilayer films. The carbon-silicon-based thin film material containing silicon quantum dots prepared through the above steps has the advantages of simple preparation process, low energy consumption, large film area, good uniformity, few defect states, and low carrier tunneling barrier. The method provided by the invention has good application prospects in the preparation and application of silicon quantum dot photoelectric devices.

Description

technical field [0001] The invention belongs to the technical field of film material preparation, and in particular relates to a method for preparing a silicon-containing quantum dot carbon-silicon-based film material. technical background [0002] Since silicon quantum dot nano-film material can greatly improve the photoelectric conversion efficiency of silicon-based solar cells, it has broad application prospects in high-efficiency solar cells. In addition, as we all know, integrated circuits developed on silicon materials have become the key to the development of information technologies such as electronic computers, communications and automatic control. With the development of information technology, higher requirements are put forward for information transmission speed, storage capacity and processing function, but silicon-based integrated circuits are limited by device size and electron movement speed. If optoelectronic technology can be introduced into silicon chips ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H01L21/02H01L31/0352H01L31/20
CPCH01L21/02381H01L21/02527H01L21/02529H01L21/0262H01L31/035218H01L31/202Y02P70/50
Inventor 姜礼华肖业权谭新玉孙宜华向鹏肖婷
Owner CHINA THREE GORGES UNIV
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