Method for preparing carbon silicon-based thin film material containing silicon quantum dots
A technology of silicon quantum dots and thin-film materials, which is applied in the field of preparation of silicon-containing quantum dots and carbon-silicon-based thin-film materials, can solve the problems of incompatibility with silicon integration processes, inability of electrons to transition, and low luminous efficiency
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Embodiment 1
[0014] A method for preparing a silicon-containing quantum dot carbon-silicon-based film material, the method comprising the following steps:
[0015] (1) Clean the monocrystalline silicon substrate with standard RCA cleaning technology;
[0016] (2) A non-stoichiometric silicon carbide film containing silicon quantum dots is deposited on the surface of a single crystal silicon substrate by plasma-enhanced chemical vapor deposition technology. The preparation process parameters are: RF power 50W, RF frequency 13.56MHz, substrate temperature 180 ℃, chamber pressure 60Pa, use hydrogen to dilute SiH with a volume concentration of 10% 4 Gas 30sccm, CH with a purity of 99.999% 4 Gas 20sccm, coating time 3 minutes;
[0017] (3) Deposit an amorphous carbon film on a non-stoichiometric silicon carbide film by using plasma-enhanced chemical vapor deposition technology. The preparation process parameters are: RF power 60W, RF frequency 13.56MHz, substrate temperature 180°C, chamber pr...
Embodiment 2
[0021] A method for preparing a silicon-containing quantum dot carbon-silicon-based film material, the method comprising the following steps:
[0022] (1) Clean the monocrystalline silicon substrate with standard RCA cleaning technology;
[0023] (2) A non-stoichiometric silicon carbide film containing silicon quantum dots is deposited on the surface of a single crystal silicon substrate by plasma-enhanced chemical vapor deposition technology. The preparation process parameters are: RF power 100W, RF frequency 13.56MHz, substrate temperature 250 ℃, chamber pressure 90Pa, use hydrogen to dilute SiH with a volume concentration of 10% 4 Gas 40sccm, CH with a purity of 99.999% 4 Gas 25sccm, coating time 5 minutes;
[0024] (3) Amorphous carbon film was deposited on non-stoichiometric silicon carbide film by plasma-enhanced chemical vapor deposition technology. The preparation process parameters were: RF power 80W, RF frequency 13.56MHz, substrate temperature 250°C, cavity pressu...
Embodiment 3
[0028] A method for preparing a silicon-containing quantum dot carbon-silicon-based film material, the method comprising the following steps:
[0029] (1) Clean the monocrystalline silicon substrate with standard RCA cleaning technology;
[0030] (2) A non-stoichiometric silicon carbide film containing silicon quantum dots is deposited on the surface of a single crystal silicon substrate by plasma-enhanced chemical vapor deposition technology. The preparation process parameters are: RF power 75W, RF frequency 13.56MHz, substrate temperature 220 ℃, chamber pressure 70Pa, use hydrogen to dilute SiH with a volume concentration of 5% 4 Gas 25 sccm, CH with a purity of 99.999% 4 Gas 20sccm, coating time 7 minutes;
[0031] (3) Deposit an amorphous carbon film on a non-stoichiometric silicon carbide film by using plasma-enhanced chemical vapor deposition technology. The preparation process parameters are: RF power 70W, RF frequency 13.56MHz, substrate temperature 220°C, cavity pre...
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