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Functional device and test mode startup circuit and method thereof

A test mode and start-up circuit technology, applied to circuits, electrical components, electric solid-state devices, etc., can solve problems such as damage to integrated circuit devices

Active Publication Date: 2018-05-29
HIMAX ANALOGIC INC
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] However, integrated circuit devices may accidentally switch to test mode due to the influence of noise, such as ground noise occurring at the input of the test mode enable signal
On the other hand, if the voltage level of this control voltage is higher than the highest voltage that the internal components of the integrated circuit device can withstand, the internal components of these integrated circuit devices may be damaged due to the input of the control voltage

Method used

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  • Functional device and test mode startup circuit and method thereof
  • Functional device and test mode startup circuit and method thereof

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Embodiment Construction

[0029] Please refer to figure 1 . figure 1 It is a circuit diagram of a functional device 1 in an embodiment of the present invention. The functional device 1 includes a test mode enabling circuit 10 and a functional circuit 12 .

[0030] In various embodiments, a functional circuit may be any circuit configured to perform a specific function. The functional circuit 12 can operate in the operation mode and the test mode, and the test mode activation circuit 10 can be used to generate a test mode activation signal AT to the functional circuit 12 to switch the functional circuit 12 from the operation mode to the test mode.

[0031] The test mode starting circuit 10 includes: a pulse signal generating module 100 , a capacitive resistance circuit 102 , a current generating module 104 , an output capacitor 106 and a comparator 108 .

[0032] The pulse signal generating module 100 generates a pulse signal CLK to an input terminal IN. In one embodiment, the input terminal IN is a...

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Abstract

A functional device and its testing mode starting circuit and method. The test mode startup circuit includes: a pulse signal generating module, a capacitive resistance circuit, a current generating module, an output capacitor and a comparator. The pulse signal generation module generates a pulse signal to the input terminal. The capacitive resistance circuit is electrically connected to the input end to receive the pulse signal and generate a trigger signal every preset time period. The current generation module generates charging current to the output terminal in response to the trigger signal. The output capacitor is electrically connected to the output terminal to receive the charging current and gradually increase the output voltage of the output terminal. The comparator is electrically connected to the output terminal to receive the output voltage and the reference voltage, wherein the comparator compares the output voltage and the reference voltage to generate a test mode start signal when the output voltage is greater than the reference voltage.

Description

technical field [0001] The present invention relates to a circuit design technology, and in particular to a functional device and its test mode activation circuit and method. Background technique [0002] Semiconductor integrated circuits usually use a test mode enable circuit to generate a test mode enable signal. The test mode start signal switches the integrated circuit device into a test mode to test functional circuits in the integrated circuit device. In known designs, the test mode enable signal is implemented by a control voltage above or below a specific voltage level. When the integrated circuit device detects the control voltage, it switches from the operation mode to the test mode. [0003] However, the integrated circuit device may accidentally switch to the test mode due to the influence of noise, such as ground noise occurring at the input terminal of the test mode enable signal. On the other hand, if the voltage level of the control voltage is higher than ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H01L23/58
Inventor 李秋平
Owner HIMAX ANALOGIC INC