Method for determining vibration fault distribution of anti-skid brake control device

Abstract

The invention discloses a method for determining vibration fault distribution of an anti-skid brake control device. According to the method, components used in the anti-skid brake control device are extracted to carry out vibration fault test, and the vibration fault distribution of the components is determined according to the test data to serve as basis for selecting fault distribution formulas in the projects, so that the errors and resource consumption caused in the prior art are eliminated. According to the method, the vibration fault distribution of the anti-skid brake control device is calculated by adopting Weibull distribution so as to prove that the faults of the anti-skid brake control device are loss faults, so that the mistake of handling the loss faults as accidental faults and the errors caused by unclear fault reasons and incorrect fault mechanism analysis in the prior art are corrected.

Description

technical field [0001] The invention relates to the field of vibration fault analysis of civil transport aircraft electronic products, in particular to a method for determining the vibration fault distribution of an anti-skid brake control device. Background technique [0002] The anti-skid brake control device is an electronic product, and electronic products both at home and abroad use exponential distribution for fault analysis and reliability prediction. [0003] The anti-skid brake control device is an accessory of the electronic anti-skid brake system of the aircraft. The power supply is provided by the aircraft, and the electrical signal of the wheel speed change is sensed by the receiver wheel speed sensor. control. The anti-skid brake control device can complete normal landing anti-skid brake control, take-off line brake control, wheel-to-wheel protection control, grounding protection control, and wheel anti-rotation brake functions after the landing gear is retrac...

AI Technical Summary

Problems solved by technology

[0067] 3) The reliability prediction model does not distinguish failure modes

[0071] 1) The test and use data prove that the damage of electronic components does not necessarily obey the exponential distribution. If the exponential distribution is not obeyed, processing with the exponential distribution will bring errors;

[0072] 2) In the process of predicting the fault, the cause of the fault is not distinguished

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