Method for Determining the Distribution of High Temperature Faults in Antiskid Brake Control Devices
A fault distribution and control device technology, which is applied to measuring devices, testing electrical devices in transportation, instruments, etc., can solve problems such as errors
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[0152] This embodiment is a method for determining the high-temperature fault distribution of an anti-skid brake control device of a certain type of aircraft.
[0153] The high-temperature faults of the anti-skid brake control device are caused by high-temperature faults of electronic components. Therefore, determining the high-temperature fault distribution of the anti-skid brake control device is to determine the high-temperature fault distribution of the electronic components that make up the anti-skid brake control device. The test time to determine the high-temperature fault distribution of all electronic components is long and expensive, and there is no precedent for all electronic components to be tested for high-temperature fault distribution in engineering. In this embodiment, based on the principle of mathematical statistics, the sampling method is used to determine the distribution of high-temperature faults of the control box, that is, the fault distribution of the ...
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