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Method of determining high-temperature fault distribution of anti-skid brake control device

A fault distribution and control device technology, applied to measuring devices, testing electrical devices in transportation, instruments, etc., can solve problems such as errors

Inactive Publication Date: 2016-10-26
XIAN AVIATION BRAKE TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0067] The disadvantages of the prior art are: a large number of tests and use data prove that the damage of electronic components does not necessarily obey the exponential distribution, and in the case of not obeying the exponential distribution, using the exponential step-by-step processing will bring errors

Method used

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  • Method of determining high-temperature fault distribution of anti-skid brake control device
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  • Method of determining high-temperature fault distribution of anti-skid brake control device

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Embodiment Construction

[0152] This embodiment is a method for determining the high-temperature fault distribution of an anti-skid brake control device of a certain type of aircraft.

[0153] The high-temperature faults of the anti-skid brake control device are caused by high-temperature faults of electronic components. Therefore, determining the high-temperature fault distribution of the anti-skid brake control device is to determine the high-temperature fault distribution of the electronic components that make up the anti-skid brake control device. The test time to determine the high-temperature fault distribution of all electronic components is long and expensive, and there is no precedent for all electronic components to be tested for high-temperature fault distribution in engineering. In this embodiment, based on the principle of mathematical statistics, the sampling method is used to determine the distribution of high-temperature faults of the control box, that is, the fault distribution of the ...

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Abstract

The invention discloses a method of determining high-temperature fault distribution of an anti-skid brake control device. Components used in the anti-skid brake control device are taken for high-temperature fault test, the high-temperature fault distribution for the components is determined according to test data to serve as a basis for selecting a fault distribution formula in a project, and errors and resource consumption brought in the prior art are eliminated. Weibull distribution is determined to be adopted to evaluate high-temperature fault of the anti-skid brake control device, the fault of the anti-skid brake control device is proved to be wear fault, the mistake that the wear fault is handled as accidental fault in the prior art is corrected, and errors generated in aspects of fault reasons and a fault mechanism are corrected.

Description

technical field [0001] The invention relates to the field of high-temperature fault analysis of electronic products of civil transport aircraft, in particular to a method for determining the high-temperature fault distribution of an anti-skid brake control device. Background technique [0002] The anti-skid brake control device is an accessory of the electronic anti-skid brake system of the aircraft. The power supply is provided by the aircraft, and the electrical signal of the wheel speed change is sensed by the receiver wheel speed sensor. control. The anti-skid brake control device can complete normal landing anti-skid brake control, take-off line brake control, wheel-to-wheel protection control, grounding protection control, and wheel anti-rotation brake functions after the landing gear is retracted. [0003] The anti-skid brake control device is an electronic product, and both domestic and foreign electronic products use exponential distribution for reliability predict...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/00
CPCG01R31/005
Inventor 乔建军
Owner XIAN AVIATION BRAKE TECH
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