LED aging tester suitable for lamp beads of multiple models
A tester and model lamp technology, applied in the field of LED aging tester, can solve the problem of inaccurate test results
Pending Publication Date: 2017-02-22
昆山明创电子科技有限公司
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Problems solved by technology
[0002] With the continuous promotion of the concept of environmental protection and energy saving in the society, the use of LED lamps is becoming more and more popular. In the later stage of the production and processing of LED lamp beads, it is necessary to test the lamp beads for conventional aging, accelerated aging, and photoaging. However, lamp beads The aging speed has a great relationship with the condition and the distance between the lamp beads. Different distances have different effects on the aging speed. However, the position of the socket of the lamp beads of the existing side-view instrument is fixed, resulting in a gap between the lamp beads. The spacing does not necessarily correspond to the size of the actual product, resulting in inaccurate test results, and often requires customized instruments for different types of lamp beads
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[0017] The preferred embodiments of the present invention will be described in detail below in conjunction with the accompanying drawings, so that the advantages and features of the present invention can be more easily understood by those skilled in the art, and the protection scope of the present invention will be defined more clearly.
[0018] Such as Figure 1-Figure 4 As shown, an LED aging tester suitable for multiple types of lamp beads includes a substrate 1, with slide rails 2 on both sides of the substrate 1, and a plurality of carrier bars 3 perpendicular to the slide rail 2, and the two ends of the carrier bar 3 The slide is clamped on the slide rails 2 on both sides, and a number of lamp positions 4 are slidably arranged on the carrier strip 3. The lamp positions 4 include a lamp holder 41 and a lamp holder 42. A tail pin 44 is provided under the lamp holder. Both sides of the tail pin 44 are provided with marbles 45, the lamp holder 41 is provided with a needle groov...
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The invention discloses an LED aging tester suitable for lamp beads of multiple models. The LED aging tester comprises a substrate. Slide rails are arranged at the two sides of the substrate. Multiple carrier strips area arranged in a way of being perpendicular to the slide rails. The two ends of the carrier strips are slidably clamped on the slide rails arranged on the two sides. The carrier strips are slidably provided with multiple lamp positions. Each lamp position comprises a lamp base and a lamp stand. A tail pin is arranged below the lamp stand. The two sides of the tail pin are provided with elastic beads. The lamp base is provided with a pin groove corresponding to the tail pin. The two sides of the pin groove are provided with clamping grooves corresponding to the elastic beads. The lamp stand is inserted on the lamp base. The upper end of the lamp stand is provided with an inserting port. The lamp base is slidably arranged on the carrier strips. The test lamp positions can be adjusted according to the actual distance between the product lamp beads so that the test result is enabled to further meet the actual situation. The test lamp positions can be adjusted according to the actual distance between the product lamp beads so that one instrument can be suitable for multiple products, the test result is enabled to further meet the actual situation, and lamp beads of different models can be tested.
Description
Technical field [0001] The invention belongs to the technical field of LED testing and, in particular, relates to an LED aging tester suitable for multiple types of lamp beads. Background technique [0002] As the society continues to promote the concept of environmental protection and energy saving, the use of LED lamps is becoming more and more popular. In the later stage of the production and processing of LED lamp beads, it is necessary to carry out conventional aging, accelerated aging and photoaging tests on the lamp beads. The aging speed has a great relationship with the condition and the distance between the lamp beads. Different distances have different effects on the aging speed. However, the socket positions of the lamp beads of the existing side-view instruments are fixed, causing the lamp beads to The spacing does not necessarily correspond to the size of the actual product, resulting in inaccurate test results, and custom instruments are often required for differen...
Claims
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IPC IPC(8): G01R31/44G01R1/04
CPCG01R1/0416G01R31/44
Inventor 李俊武黎增祺刘双龙黎伟黄团结
Owner 昆山明创电子科技有限公司