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Voltage or current measurement device and voltage or current measurement method for random waveform and random point

A current measurement device and arbitrary waveform technology, applied in the direction of measuring devices, measuring electrical variables, measuring current/voltage, etc., can solve problems such as system error, arbitrary waveform generator does not have the ability to measure voltage or current, and measurement results are difficult to stabilize , to achieve stable frequency characteristics, high common-mode rejection ratio, suppression of overshoot and distortion

Active Publication Date: 2017-04-26
THE 41ST INST OF CHINA ELECTRONICS TECH GRP
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Traditional arbitrary waveform generators do not have the ability to measure voltage or current, and need to cooperate with other instruments such as oscilloscopes to perform measurements with similar functions. However, this type of solution consists of multiple instruments, and the measurement results are difficult to stabilize, and errors in the system are unavoidable.

Method used

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  • Voltage or current measurement device and voltage or current measurement method for random waveform and random point
  • Voltage or current measurement device and voltage or current measurement method for random waveform and random point

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Embodiment Construction

[0022] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0023] See figure 1 , a voltage or current measurement device at any point of an arbitrary waveform, comprising a waveform generation module 1, a voltage and current sampling circuit module 2 and an acquisition measurement storage module 3; the waveform generation module includes a field programmable gate array FPGA connected in sequence, High-speed differential D / A converter 11 and back-end processing circuit 12; Acquisition and measurement storage module inc...

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PUM

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Abstract

The invention discloses a voltage or current measurement device and a voltage or current measurement method for a random waveform and a random point. The method comprises the steps of in defining waveform data, respectively setting measurement events for different waveform sequences, after the waveform is transmitted through a high-speed differential D / A converter and a backend processing circuit, loading the waveform from an external port to a loading end; sampling the voltage or current which is applied on the load end by a voltage and current sampling circuit, and after processing by a frontend processing circuit, making a high-speed A / D converter perform data acquisition by an FPGA; and when a certain waveform sequence is output to measurement starting time, storing the acquired voltage or current data into an acquisition memory by a system according to a measurement event which is customized by a user. According to the voltage or current measurement device and the voltage or current measurement method, through applying a series of linear waveforms which can be measured in real time to the load end, voltage change or current change at the load end is observed. The voltage or current measurement device and the voltage or current measurement method can be widely applied in various random waveform generators and semiconductor device analyzers.

Description

technical field [0001] The invention relates to the field of arbitrary waveform generation and measurement, in particular to a voltage or current measurement device and method for any point of an arbitrary waveform. Background technique [0002] In high-speed measurement applications, it is often necessary to make voltage or current measurements at any point on an arbitrary waveform to observe the transient response of the load. Traditional arbitrary waveform generators do not have the ability to measure voltage or current, and need to cooperate with other instruments such as oscilloscopes to perform measurements with similar functions. However, this type of solution consists of multiple instruments, and the measurement results are difficult to stabilize, and system errors are unavoidable. In order to obtain stable and consistent measurement results, it is necessary to combine arbitrary waveform generation with voltage and current measurement to form a complete measurement s...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R19/165G01R13/00
CPCG01R13/00G01R19/165
Inventor 王俊生张永坡栗永强王文廷戚瑞民李雷
Owner THE 41ST INST OF CHINA ELECTRONICS TECH GRP
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