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LTE comprehensive test instrument-based frame header detecting method and LTE comprehensive test instrument

A comprehensive tester and frame header technology, applied in the field of terminal testing, can solve problems such as time-consuming, uncertain data sub-frame numbers, etc., and achieve the effect of accurate frame header position

Active Publication Date: 2017-10-24
DATANG LINKTESTER TECH
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  • Claims
  • Application Information

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Problems solved by technology

[0012] Moreover, this method needs to know the subframe number of the currently received data to do related calculations. Since there is no synchronization process, the data is forced to be sent and received, so the receiving end is not sure about the subframe number of the data, so the frame number must be passed before the relevant calculation. The process of blind inspection consumes a lot of time

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  • LTE comprehensive test instrument-based frame header detecting method and LTE comprehensive test instrument
  • LTE comprehensive test instrument-based frame header detecting method and LTE comprehensive test instrument
  • LTE comprehensive test instrument-based frame header detecting method and LTE comprehensive test instrument

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Embodiment Construction

[0061] In order to make the above objects, features and advantages of the present invention more comprehensible, the present invention will be further described in detail below in conjunction with the accompanying drawings and specific embodiments.

[0062] One of the core concepts of the embodiments of the present invention is to start with the LTE time-domain signal sent by the terminal itself, and use the N CP,l N of data and data tail (ie guard interval) CP,l According to the characteristics of equal data, calculate the variance of each sampling point in the preset threshold sampling points, and detect the frame header position of LTE uplink data according to the sampling point with the smallest variance, so as to obtain a more accurate frame header position.

[0063] refer to figure 1 , shows a flow chart of the steps of Embodiment 1 of a frame header detection method based on an LTE comprehensive tester of the present invention, which may include the following steps:

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Abstract

The embodiment of the invention provides an LTE comprehensive test instrument-based frame header detecting method and a LTE comprehensive test instrument. The method comprises the steps of receiving LTE uplink data sent from a terminal by the LTE comprehensive test instrument, wherein the LTE uplink data includes a plurality of time-domain signals, and the time-domain signals comprise a plurality of sampling points; acquiring sampling points of a preset threshold number, and calculating the characteristic value of each sampling point; according to the position of a sampling point with a minimum characteristic value, determining the position of the frame header of the LTE uplink data. According to the embodiment of the invention, the influence of data frequency offset is avoided. Meanwhile, compared with a method for detecting the position of the frame header only based on power, the position of the frame header can be obtained more accurately.

Description

technical field [0001] The invention relates to the technical field of terminal testing, in particular to a frame header detection method based on an LTE comprehensive tester and an LTE comprehensive tester. Background technique [0002] With the rapid development of mobile communication systems, terminals supporting multiple standards have also been rapidly developed. At present, terminal manufacturers have developed related products supporting multiple standards such as GSM, WCDMA, TD-SCDMA, and LTE. Before these terminal products enter the network, they need to be tested for conformance, and the radio frequency conformance test is the most basic test, and there are many test cases. [0003] The radio frequency conformance test for terminals of these different standards is generally an integrated test equipment, which is called a comprehensive tester. At present, comprehensive tester products require a complete frame of data to obtain correct measurement results under LTE...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H04L1/00
CPCH04L1/0045H04L1/0057H04L27/2671H04L27/3854
Inventor 王贵磊
Owner DATANG LINKTESTER TECH