LTE comprehensive test instrument-based frame header detecting method and LTE comprehensive test instrument
A comprehensive tester and frame header technology, applied in the field of terminal testing, can solve problems such as time-consuming, uncertain data sub-frame numbers, etc., and achieve the effect of accurate frame header position
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[0061] In order to make the above objects, features and advantages of the present invention more comprehensible, the present invention will be further described in detail below in conjunction with the accompanying drawings and specific embodiments.
[0062] One of the core concepts of the embodiments of the present invention is to start with the LTE time-domain signal sent by the terminal itself, and use the N CP,l N of data and data tail (ie guard interval) CP,l According to the characteristics of equal data, calculate the variance of each sampling point in the preset threshold sampling points, and detect the frame header position of LTE uplink data according to the sampling point with the smallest variance, so as to obtain a more accurate frame header position.
[0063] refer to figure 1 , shows a flow chart of the steps of Embodiment 1 of a frame header detection method based on an LTE comprehensive tester of the present invention, which may include the following steps:
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