Circuit testing device for integrated chip

Abstract

The invention discloses a circuit testing device for an integrated chip. The circuit testing device comprises a fixed bottom plate, wherein an intelligent transfer mechanism is arranged on the right side of an upper end face of the fixed bottom plate; a main case is arranged above the intelligent transfer mechanism; a testing controller is arranged on the right side inside the main case; the lowerend of a lifting sleeve penetrates out of an opening of a lifting groove and is connected with a detection connecting device; a connecting plate extending to the left is fixedly connected to the lower end of a left end face of the main case; a recovery box is arranged in a middle position on an upper end face of the fixed bottom plate. During operation, equipment operation in the detection process is controlled by the testing controller, detection information can be collected in a digitized manner and then displayed by a display panel, convenience is brought to data observation in the detection process and intelligent data storage, human factor interference in the artificial discrimination and recording process is avoided, an error proofing function of the device is enhanced, operations of detecting, screening and separating are completed by the same device, the equipment cost is reduced, and the working efficiency is increased.

Description

technical field [0001] The invention relates to the field of integrated testing, in particular to a circuit testing device for integrated chips. Background technique [0002] With the development of integrated circuits, more and more functions are expected to be concentrated in a small chip. Performance testing is a very important functional module. The current testing method is generally manual insertion and unplugging. Judging the damage state and recording it. For the interference of human factors, the delivery rate of unqualified products has always been a problem. There are also automatic detection devices on the market, but there is a common problem. The chip is severely worn during the insertion process, which is easy to cause damage to the contact plate. The pins on the device are damaged, which increases the cost, and it is also easy to cause a large amount of economic losses due to misjudgment of the device. Contents of the invention [0003] The object of the p...

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Problems solved by technology

[0002] With the development of integrated circuits, more and more functions are expected to be concentrated in a small chip. Performance testing is a very important functional module. The current testing method is generally manual plugging and unplugging. Judging the damage state and recording it. For the interference of human factors, the delivery rate of unqualified products has always been a problem. There are also automatic detection devices on the market, but there is a common problem. The chip is severely worn during insertion, which is easy to cause damage to the contact plate. The pins on the device are damaged, which increases the cost, and it is also easy to cause a lot of economic losses due to misjudgment of the device

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