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Cleaning device for attenuated total reflection infrared spectrometer sample table

An infrared spectrometer and attenuated total reflection technology, which is applied in the field of a sample table cleaning device of an attenuated total reflection infrared spectrometer, and can solve problems such as difficulty in cleaning the sample table

Active Publication Date: 2018-11-16
FUJIAN NORMAL UNIV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] For this reason, it is necessary to provide a sample stage cleaning device for attenuated total reflection infrared spectrometer to solve the problem of difficult cleaning of the sample stage

Method used

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  • Cleaning device for attenuated total reflection infrared spectrometer sample table
  • Cleaning device for attenuated total reflection infrared spectrometer sample table
  • Cleaning device for attenuated total reflection infrared spectrometer sample table

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Embodiment Construction

[0025] In order to explain in detail the technical content, structural features, achieved goals and effects of the technical solution, the following will be described in detail in conjunction with specific embodiments and accompanying drawings.

[0026] see figure 1 , figure 2 as well as image 3 , the present invention provides a sample stage cleaning device for an attenuated total reflection infrared spectrometer, including a sample stage 1 and an ATR assembly 2. The ATR assembly refers to an attenuated total reflection assembly of an attenuated total reflection infrared spectrometer. The full English name of the ATR assembly is: Attenuated Total Reflectance, the ATR assembly is arranged above the sample stage for detecting samples on the sample stage. The sample stage is generally made of materials such as thallium bromide / thallium iodide, zinc selenide, selenium / silicon / arsenide glass or germanium. The working principle of the sample stage of the attenuated total reflec...

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Abstract

The invention relates to a cleaning device for an attenuated total reflection infrared spectrometer sample table. A cleaning mechanism and a spraying head mechanism are both fixedly arranged on an ATRassembly. The spraying head mechanism comprises a spraying head, a cleaning agent container and a pump, wherein the cleaning agent container is used for containing a cleaning agent, the liquid inletend of the pump is connected into the cleaning agent container through a pipeline, the liquid outlet end of the pump is connected with the spraying head through a pipeline, and the spraying head facesthe sample table. The cleaning mechanism comprises a scraping blade, a telescopic scraping arm and an electric rotary connector, wherein one end of the telescopic scraping arm is fixed to the ATR assembly, the other end of the telescopic scraping arm is connected to the upper portion of the scraping piece through the electric rotary connector, and the lower portion of the scraping piece makes contact with the upper surface of the sample table. A single-chip microcomputer is used for controlling the cleaning mechanism to spray the cleaning agent onto the sample table and controlling the electric rotary connector to drive the scraping piece to rotatably clean the sample table through scraping, so that mutual influences of detection results of liquid samples are avoided; and automatic operation is achieved, so that both hands of experimenters are liberated.

Description

technical field [0001] The invention relates to the field of infrared spectrometer cleaning, in particular to a sample stage cleaning device for an attenuated total reflection infrared spectrometer. Background technique [0002] When performing infrared detection, the liquid sample is directly dropped on the sample stage of the attenuated total reflection infrared spectrometer, and the ATR component is used to detect the spectrum of the liquid sample. Before the next liquid sample detection, it is necessary to manually wipe the sample stage with cotton. After wiping, the sample The liquid sample left over from the previous test still remains on the stage, and it is necessary to wait for the remaining sample on the sample stage to dry naturally or with a fan before performing the next liquid sample test. This kind of operation is not only time-consuming and cumbersome. If the sample left on the sample stage is not completely cleaned up before the next test, it will affect the...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): B08B1/04B08B3/08
CPCB08B3/08B08B1/32
Inventor 蔡开聪侯彦君
Owner FUJIAN NORMAL UNIV
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