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Manufacturing method of transistor

A manufacturing method and transistor technology, applied in semiconductor/solid-state device manufacturing, semiconductor devices, electrical components, etc., can solve problems such as unstable device amplification factors, and achieve the effect of stabilizing current amplification factors

Inactive Publication Date: 2018-12-28
深圳市福来过科技有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

On the surface of the base region and the emitter region, a large number of processes will be experienced, such as implantation, etching, metallization, etc., which will bring a large number of defects to the surface of the base region and the emitter region, which will eventually lead to a very unstable amplification factor of the device.

Method used

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  • Manufacturing method of transistor
  • Manufacturing method of transistor
  • Manufacturing method of transistor

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0014] see figure 1 and figure 2 , a method for manufacturing a transistor, comprising:

[0015] Step S01: providing a substrate 1 of a first conductivity type;

[0016] Step S02: growing an epitaxial layer 2 with a second conductivity type on the first surface of the substrate 1;

[0017] Step S03: forming a first trench a1 in the epitaxial layer 2, the first trench a1 passing through the epitaxial layer 2 and connecting to the substrate 1 at one end;

[0018] Step S04: forming a sidewall b1 on the sidewall of the epitaxial layer 2, the sidewall b1 is formed in the trench and one end thereof is in contact with the substrate 1;

[0019] Step S05: forming an emitter region 3 in the trench; the emitter region 3 includes a first isolation layer 31, an emitter layer 32 and a second isolation layer 33 sequentially formed upward on the first surface of the substrate 1 ;

[0020] Step S06: removing the sidewall b1 to form a base trench a2; forming a base region 4 of the first c...

Embodiment 2

[0036] see figure 2 , a transistor manufactured based on the manufacturing method in Embodiment 1, comprising: a substrate 1 of a first conductivity type; an epitaxial layer 2 of a second conductivity type grown on the first surface of the substrate 1; a first Conductive type base region 4, which runs through the epitaxial layer 2 and is connected to the substrate 1 at one end, so that the epitaxial layer 2 forms an emitter region 3 and a collector region 52; the emitter region 3 is included in the substrate The first isolation layer 31, the emitter layer 32 and the second isolation layer 33 are sequentially formed on the first surface of 1. It can be understood that by adopting a three-layer epitaxial structure, the emitter layer 32 and the base region 4 The contact interface of the contact interface does not need to go through processes such as high-temperature rapid annealing and ion implantation in the subsequent manufacturing process, so the emitter interface will not be...

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Abstract

The invention relates to a manufacturing method of a transistor. The manufacturing method comprises the following steps: providing a substrate of a first conductivity type; growing an epitaxial layerhaving a second conductivity type on a first surface of the substrate; forming a first trench in the epitaxial layer, the first trench penetrating the epitaxial layer and having one end connected to the substrate; forming a sidewall on a sidewall of the epitaxial layer, the sidewall being formed in the trench and one end being in contact with the substrate; forming an emission region in the trench, wherein the emitter region includes a first isolation layer, an emitter layer and a second isolation layer sequentially formed on the first surface of the substrate; removing the sidewall to form abase region trench; forming a base region of a first conductivity type in the base trench. The transistor provided by the invention has simple structure and stable amplification coefficient.

Description

technical field [0001] The invention relates to the technical field of semiconductors, in particular to a transistor and a manufacturing method thereof. Background technique [0002] In the prior art, the base region is formed by an annealing process after the implantation process, and the junction depth and junction morphology of the base area are greatly affected by the annealing process, while the polycrystalline emitter process is all implanted with a large dose in the polycrystalline body, and then high temperature and rapid Thermal annealing, so that impurities diffuse into the base region to form the emitter junction. On the surface of the base region and the emitter region, a large number of processes will be experienced, such as implantation, etching, metallization, etc., which will bring a large number of defects to the surface of the base region and the emitter region, and eventually cause the amplification factor of the device to be very unstable. Contents of t...

Claims

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Application Information

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IPC IPC(8): H01L21/331H01L29/735H01L29/167
CPCH01L29/167H01L29/6625H01L29/735
Inventor 不公告发明人
Owner 深圳市福来过科技有限公司